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Search Publications

NIST Authors in Bold

Displaying 1401 - 1425 of 2714

The Proper Use of Substitute Test Fluids

July 18, 2011
Author(s)
Marc A. Buttler
Liquid-measuring devices are used in many different commercial applications. The vast array of liquid products that are measured includes some products that may pose difficulties in testing. NIST Handbook 44 allows for substitution of fluids during testing

Dimensional Analysis of Through Silicon Vias Using the TSOM Method

July 12, 2011
Author(s)
Ravikiran Attota, Andrew Rudack
There is a great need for accurate, truly-3D metrology solutions that can be used for analysis of high aspect ratio features such as through-silicon-vias (TSVs). Through-focus scanning optical microscopy (TSOM) is an optical metrology method that provides

Fate of nanoparticles during life cycle of polymer nanocomposites

July 6, 2011
Author(s)
Tinh Nguyen, Bastien T. Pellegrin, Coralie Bernard, Xiaohong Gu, Justin M. Gorham, Paul E. Stutzman, Deborah S. Jacobs, Walter E. Byrd, John W. Hettenhouser, Joannie W. Chin
Nanoparticles are increasingly used in consumer and structural polymeric products to enhance a variety of properties. Under the influences of environmental factors (e.g., ultraviolet, moisture, temperature) and mechanical actions (e.g., scratching

Chapter 21 Calibration of Aerosol Instruments

July 5, 2011
Author(s)
Bean T. Chen, Robert A. Fletcher, Yung-Sung Cheng
This chapter reviews calibration techniques relevant to aerosol measurement devices, such as sizing instruments, condensation nuclei counters, and mass monitors. The generation methods for test aerosols and important parameters in instrument calibration

Embedded Capacitive Displacement Sensor for Nanopositioning Applications

July 1, 2011
Author(s)
Svetlana Avramov-Zamurovic1, Nicholas Dagalakis, Rae Duk Lee, Jae M. Yoo, Seung H. Yang
The scale of nano objects requires very precise position determination. The state-of-the-art manipulators involve accurate nanometer positioning. The paper presents the design, fabrication process and testing of a capacitance based displacement sensor

Evaluating the characteristics of multiwall carbon nanotubes

July 1, 2011
Author(s)
John H. Lehman, M. Terrones, Elisabeth Mansfield, Katie Hurst, Vincent Muenier
During the past 20 years, multiwall carbon nanotubes (MWCNTs) have become an important industrial material. Hundreds of tons are produced each year. This review is a survey of the scientific literature, motivated by industrial requirements and guidelines

IEEE TC-10: Update 2011

July 1, 2011
Author(s)
Nicholas G. Paulter Jr., Thomas E. Linnenbrink, W. B. Boyer, S. J. Tilden, Travis Ellis
There is a world-wide need to standardize terms, test methods, and the computation of performance parameters for devices that generate, measure, and analyze waveforms. Users need to be able to unambiguously specify the device performance required for

PROFICIENCY TESTING IN U.S. STATE WEIGHTS AND MEASURES LABORATORIES

June 21, 2011
Author(s)
Elizabeth Benham, Georgia L. Harris, Val R. Miller
The National Institute of Standards and Technology (NIST) Weights and Measures Division (WMD) manages a program for State Weights and Measures laboratories that includes: 1) laboratory Recognition following ISO/IEC 17025:2005 [1, 8] and sponsorship of

Report of the 95th National Conference on Weights and Measures

June 10, 2011
Author(s)
Linda D. Crown, Tina G. Butcher, Steven E. Cook, Lisa Warfield, David A. Sefcik
The 95th Annual Meeting of the National Conference on Weights and Measures (NCWM) was held July 11 to 15, 2010, at the Crowne Plaza St. Paul Riverfront, St. Paul, Minnesota. The theme of the meeting was “Breaking Molds to Shape the Future.” Reports by the

Deembedding parasitic elements of GaN nanowire MESFETs by use of microwave measurements

June 3, 2011
Author(s)
Dazhen Gu, Thomas M. Wallis, Paul T. Blanchard, SangHyun S. Lim, Atif A. Imtiaz, Kristine A. Bertness, Norman A. Sanford, Pavel Kabos
We present a deembedding roadmap for extracting parasitic elements of a nanowire (NW) MESFET device from full two-port scattering-parameter measurements in the frequency range from 0.1 GHz to 25 GHz. The NW MESFET is integrated in a microwave coplanar

Microwave Characterization of Transparent Conducting Films

May 26, 2011
Author(s)
Jan Obrzut, Oleg A. Kirillov
The high frequency conductivity of thin metallic and graphitic nano-films attracts interest due to many potential applications in spin electronics, electromagnetic shielding, flexible antennas, displays, and solar cells. The surface morphology of thin

Electrical Reliability Testing of Single-Walled Carbon Nanotube Networks

May 18, 2011
Author(s)
Mark C. Strus, Ann C. Chiaramonti Debay, Robert R. Keller, Yung J. Jung, Younglae Kim
We present test methods to investigate the electrical reliability of nanoscale lines of highly-aligned, networked, metallic/semiconducting single-walled carbon nanotubes (SWCNTs) fabricated through a template-based fluidic assembly process. We find that

Progress on CD-AFM tip width calibration standards

May 10, 2011
Author(s)
Ronald G. Dixson, Boon Ping Ng, Craig D. McGray, Ndubuisi G. Orji, Jon C. Geist
The National Institute of Standards and Technology (NIST) is developing a new generation of standards for calibration of CD-AFM tip width. These standards, known as single crystal critical dimension reference materials (SCCDRM) have features with near

Dual-wavelength transfer standard for laser peak-power measurement

May 9, 2011
Author(s)
Rodney W. Leonhardt, Daniel King
The National Institute of Standards and Technology (NIST) and the Naval Surface Warfare Center – Corona Division (NSWC) have jointly developed a low-level peak-power radiometer (D-ESR) which functions as a transfer standard for measuring laser pulses at

Grain Moisture Meter Test Methods and Tolerances

May 2, 2011
Author(s)
Gloria D. Lee
Due to the significant economic impact of each grain moisture meter and the importance of applying correct test methods and tolerances, this article has been written to answer recent inquires regarding using the two test methods in NIST Handbook 44

Evaluation of Bias for Two Charpy Impact Machines Using the Same Instrumented Striker

May 1, 2011
Author(s)
Christopher N. McCowan, Enrico Lucon, Raymond L. Santoyo
Two Charpy machines were used to test NIST verification specimens at three energy levels: low energy (≈ 15 J at -40°C), high energy (≈ 100 J at -40°C) and super-high energy (≈ 240 J at room temperature). The study evaluates the differences observed for the

NIST Handbook 133: Checking the Net Contents of Packaged Goods (2011 Ed.)

April 27, 2011
Author(s)
Kenneth S. Butcher, Linda D. Crown, David Sefcik, Lisa Warfield
This handbook has been prepared as a procedural guide for the compliance testing of net contents statements on packaged goods. Compliance testing of packaged goods is the determination of the conformance results of the packaging, distribution, and

TSOM Method for Semiconductor Metrology

April 18, 2011
Author(s)
Ravikiran Attota, Ronald G. Dixson, John A. Kramar, James E. Potzick, Andras Vladar, Benjamin D. Bunday, Erik Novak, Andrew C. Rudack
Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement resolution using conventional optical microscopes; measurement sensitivities are comparable to what is typical using Scatterometry, SEM and
Displaying 1401 - 1425 of 2714
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