Verification of Noise-Parameter Measurements and Uncertainties
James P. Randa, Dazhen Gu, Dave K. Walker
We propose and implement verification methods for measurements of noise parameters of amplifiers and transistors. Because the verification rests on the comparison of different measurement results, it also serves as a test of the uncertainties. The verification process consists of first measuring separately both a passive two-port device and the amplifier or transistor of interest (the DUT) and then measuring the tandem configuration of passive device plus DUT. The results of the measurements on the tandem configuration are compared to the results predicted based on the noise parameters and scattering parameters of the two individual components. In this paper, we describe the method, give the relevant equations, discuss the uncertainty analysis, and present measurement results demonstrating application of the method. We also present simulation results demonstrating the ability of the method to detect measurement errors.
IEEE Transactions on Instrumentation and Measurement