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NIST Authors in Bold

Displaying 1401 - 1425 of 2724

A Prototype IEEE 1451.4 Smart Transducer Interface for Sensors and Actuators

August 19, 2011
Author(s)
Yuyin Song, David M. Westbrook, Kang B. Lee
Analog transducers (sensors or actuators) are widely used in industry. The Institute of Electrical and Electronics Engineers (IEEE) 1451.4 standard defines a mixed-mode communication protocol and the Transducer Electronic Data Sheet (TEDS) formats for

Precision spectroscopy with frequency combs at 3.4 ym

August 2, 2011
Author(s)
Esther Baumann, Fabrizio R. Giorgetta, William C. Swann, Alexander M. Zolot, Ian R. Coddington, Nathan R. Newbury
We discuss precision spectroscopy with a comb-based spectrometer at 3.4 υm. Our goal is to explore comb-based spectroscopy as an alternative method for fast, highly resolved, accurate measurements of gas line shapes. The spectrometer uses dual 1.5 υm

Springer Handbook of Metrology and Testing, Electrical Properties

August 1, 2011
Author(s)
Jan Obrzut, Bernd Schumacher, Heinz-Gunter Bach, Petra Spitzer
The dielectric properties of materials are used to describe electrical energy storage, dissipation and energy transfer. The most relevant physical processes in dielectric materials from the practical view point are those which result in power loss

Single-Photon Sources and Detectors

July 27, 2011
Author(s)
M D. Eisaman, Jingyun Fan, Alan L. Migdall, Sergey Polyakov
We review the current status of single-photon-source and single-photon-detector technologies operating at wavelengths from the ultraviolet to the infrared. We discuss applications of these technologies to quantum communication, a field that is currently

Large-Area Overhead Manipulator for Access of Fields

July 22, 2011
Author(s)
Jeffrey W. White, Roger V. Bostelman
Multi-axis, cable-driven manipulators have evolved over many years providing large area suspended platform access, programmability, relatively rigid and flexibly- positioned platform control and full six degree of freedom (DOF) manipulation of sensors and

The Proper Use of Substitute Test Fluids

July 18, 2011
Author(s)
Marc A. Buttler
Liquid-measuring devices are used in many different commercial applications. The vast array of liquid products that are measured includes some products that may pose difficulties in testing. NIST Handbook 44 allows for substitution of fluids during testing

Dimensional Analysis of Through Silicon Vias Using the TSOM Method

July 12, 2011
Author(s)
Ravikiran Attota, Andrew Rudack
There is a great need for accurate, truly-3D metrology solutions that can be used for analysis of high aspect ratio features such as through-silicon-vias (TSVs). Through-focus scanning optical microscopy (TSOM) is an optical metrology method that provides

Fate of nanoparticles during life cycle of polymer nanocomposites

July 6, 2011
Author(s)
Tinh Nguyen, Bastien T. Pellegrin, Coralie Bernard, Xiaohong Gu, Justin M. Gorham, Paul E. Stutzman, Deborah S. Jacobs, Walter E. Byrd, John W. Hettenhouser, Joannie W. Chin
Nanoparticles are increasingly used in consumer and structural polymeric products to enhance a variety of properties. Under the influences of environmental factors (e.g., ultraviolet, moisture, temperature) and mechanical actions (e.g., scratching

Chapter 21 Calibration of Aerosol Instruments

July 5, 2011
Author(s)
Bean T. Chen, Robert A. Fletcher, Yung-Sung Cheng
This chapter reviews calibration techniques relevant to aerosol measurement devices, such as sizing instruments, condensation nuclei counters, and mass monitors. The generation methods for test aerosols and important parameters in instrument calibration

Embedded Capacitive Displacement Sensor for Nanopositioning Applications

July 1, 2011
Author(s)
Svetlana Avramov-Zamurovic1, Nicholas Dagalakis, Rae Duk Lee, Jae M. Yoo, Seung H. Yang
The scale of nano objects requires very precise position determination. The state-of-the-art manipulators involve accurate nanometer positioning. The paper presents the design, fabrication process and testing of a capacitance based displacement sensor

Evaluating the characteristics of multiwall carbon nanotubes

July 1, 2011
Author(s)
John H. Lehman, M. Terrones, Elisabeth Mansfield, Katie Hurst, Vincent Muenier
During the past 20 years, multiwall carbon nanotubes (MWCNTs) have become an important industrial material. Hundreds of tons are produced each year. This review is a survey of the scientific literature, motivated by industrial requirements and guidelines

IEEE TC-10: Update 2011

July 1, 2011
Author(s)
Nicholas G. Paulter Jr., Thomas E. Linnenbrink, W. B. Boyer, S. J. Tilden, Travis Ellis
There is a world-wide need to standardize terms, test methods, and the computation of performance parameters for devices that generate, measure, and analyze waveforms. Users need to be able to unambiguously specify the device performance required for

PROFICIENCY TESTING IN U.S. STATE WEIGHTS AND MEASURES LABORATORIES

June 21, 2011
Author(s)
Elizabeth Benham, Georgia L. Harris, Val R. Miller
The National Institute of Standards and Technology (NIST) Weights and Measures Division (WMD) manages a program for State Weights and Measures laboratories that includes: 1) laboratory Recognition following ISO/IEC 17025:2005 [1, 8] and sponsorship of

Report of the 95th National Conference on Weights and Measures

June 10, 2011
Author(s)
Linda D. Crown, Tina G. Butcher, Steven E. Cook, Lisa Warfield, David A. Sefcik
The 95th Annual Meeting of the National Conference on Weights and Measures (NCWM) was held July 11 to 15, 2010, at the Crowne Plaza St. Paul Riverfront, St. Paul, Minnesota. The theme of the meeting was “Breaking Molds to Shape the Future.” Reports by the

Deembedding parasitic elements of GaN nanowire MESFETs by use of microwave measurements

June 3, 2011
Author(s)
Dazhen Gu, Thomas M. Wallis, Paul T. Blanchard, SangHyun S. Lim, Atif A. Imtiaz, Kristine A. Bertness, Norman A. Sanford, Pavel Kabos
We present a deembedding roadmap for extracting parasitic elements of a nanowire (NW) MESFET device from full two-port scattering-parameter measurements in the frequency range from 0.1 GHz to 25 GHz. The NW MESFET is integrated in a microwave coplanar
Displaying 1401 - 1425 of 2724
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