Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 1326 - 1350 of 1938

Directed Fabrication of Ceramic Nanostructures on Fragile Substrates Using Soft-Electron Beam Lithography (soft-eBL)

May 1, 2008
Author(s)
Suresh Donthu, Nasim Alem, Zixlao Pan, Shu-you Li, Gajendra Shekhawat, Vinayak Dravid, Kurt D. Benkstein, Stephen Semancik
We demonstrate the use of a facile nanopatterning scheme known as soft-electron beam lithography (soft-eBL) to fabricate and site-specifically position a variety of functional ceramic nanostructures onto fragile substrates: a 75-nm thick electron

Microstructure of oligofluorene asymmetric derivatives in organic thin film transistors

April 22, 2008
Author(s)
Quan Yuan, Stefan C. Mannsfeld, Ming L. Tang, Mark Roberts, Michael F. Toney, Dean DeLongchamp, Zhenan Bao
In organic thin film transistors (OTFT), modifying the molecular chemical structure affects the molecular packing and thin film morphology, which both sensitively influence the charge carrier mobility. A detailed understanding of the interplay of molecular

Self-Sealing Nanoporous Low-k Dielectric Patterns Created by Nanoimprint Lithography

April 15, 2008
Author(s)
Hyun Wook Ro, H Peng, Ken-ich Nihara, Hae-Jeong Lee, Eric K. Lin, Alamgir Karim, D Gidley, Hiropshi Jinai, Do Y. Yoon, Christopher L. Soles
In this letter we describe how highly porous nanostructures can be directly printed into a poly(methylsilsequioxane) (PMSQ)-based organosilicate film, with high pattern fidelity, and develop the measurement infrastructure to quantitatively evaluate the

Multiscale Modeling of Lattice Defects in Si-Ge(001) Quantum Wells

April 9, 2008
Author(s)
B. Yang, Vinod Tewary
A computationally efficient hybrid Green¿s function (GF) technique is developed for multiscale modeling of lattice defects in a trilayer material system that links seamlessly the length scales from lattice (sub-nanometers) to continuum (bulk). The model

Measuring the Modulus of Hydrated Contact Lenses via Surface Wrinkling

April 6, 2008
Author(s)
Jun Y. Chung, Young Jong Lee, Peyton Hopson, Michael J. Fasolka, Christopher Stafford
One of the most important considerations in the evaluation of hydrogels for biomedical and contact lens applications is the elastic modulus. The elastic modulus relates to several important factors including flexibility, comfort, adhesion, swelling

Quantifying Interfacial Adhesion in Transfer Printing via a Cantilever Peel Test

April 6, 2008
Author(s)
Jiong Liu, Jun Y. Chung, Christopher Stafford
Transfer printing has been demonstrated as a fabrication method for flexible organic electronics. The transfer printing process relies on the differential adhesion of a printable layer (PL) that is pressed between two substrates: transfer substrate (TS)

Synthesis and Characterization of Polymer Brushes from PDMS Surfaces

April 6, 2008
Author(s)
Heqing Huang, Adam J. Nolte, Jun Y. Chung, Christopher Stafford
In recent years, poly(dimethylsiloxane) (PDMS) has found increased application in the areas of microfluidic devices, chromatographic packing materials and membranes, as well as in medical and drug delivery devices. However, the hydrophobic surface of PDMS

X-Ray Imaging Optimization of 3D Tissue Engineering Scaffolds via Combinatorial Fabrication Methods

April 1, 2008
Author(s)
Yanyin Yang, Shauna M. Dorsey, Matthew Becker, Sheng Lin-Gibson, Gary E. Schumacher, Glenn M. Flaim, J Kohn, Carl G. Simon Jr.
We have developed a combinatorial method for determining optimum tissue scaffold composition for imaging by X-ray techniques. X-ray radiography and microcomputed tomography enable non-invasive imaging of implanted materials in vivo and in vitro

Characterizing Pattern Structures Using X-Ray Reflectivity

March 28, 2008
Author(s)
Hae-Jeong Lee, Christopher L. Soles, Hyun Wook Ro, Shuhui Kang, Eric K. Lin, Alamgir Karim, Wen-Li Wu
Specular X-ray reflectivity (SXR) can be used, in the limit of the effective medium approximation (EMA), as a high-resolution shape metrology for periodic patterns on a planar substrate. The EMA means that the density of the solid pattern and the space

Structure and Dynamics in Multicomponent Polyelectrolyte Solutions

March 11, 2008
Author(s)
Sanghun Lee, Vijay Tirumala, Michihiro Nagao, Taiki Tominaga, Eric K. Lin, Jian P. Gong, Wen-Li Wu
Double-network hydrogels (DN-gels) prepared from the combination of a moderately crosslinked anionic polyelectrolyte (poly(2-acrylamido-2-methyl-1-propanesulfonic acid, PAMPS) and an uncrosslinked linear polymer (polyacrylamide, PAAm) solution show strong

The Effect of Interfacial Roughness on the Thin Film Morphology and Charge Transport of High-Performance Polythiophenes

March 11, 2008
Author(s)
Y S. Jung, Regis J. Kline, Daniel A. Fischer, Eric K. Lin, Martin Heeney, Iain McCulloch, Dean DeLongchamp
We control and vary the roughness of a dielectric upon which a high-performance polymer semiconductor, poly(2,5-bis(3-alkylthiophen-2-yl)thieno[3,2-b]thiophene) (pBTTT) is cast, to determine the effects of roughness on thin-film microstructure and the

Thermodynamic Interactions in Double-Network Hydrogels

March 11, 2008
Author(s)
Taiki Tominaga, Vijay Tirumala, Sanghun Lee, Eric K. Lin, Jian P. Gong, Wen-Li Wu
Double-network hydrogels (DN-gels) prepared from the combination of a moderately crosslinked anionic polyelectrolyte and an uncrosslinked linear polymer solution exhibit mechanical properties such as fracture toughness that are intriguingly superior to

Contact-induced crystallinity for high-performance soluble acene-based transistors and circuits

March 8, 2008
Author(s)
David J. Gundlach, James E. Royer, SK Park, Sankar Subramanian, Oana Jurchescu, Behrang H. Hamadani, Andrew Moad, Regis J. Kline, LC Teague, Oleg A. Kirillov, Curt A. Richter, Lee J. Richter, Sean R. Parkin, Thomas Jackson, JE Anthony
The use of organic materials presents a tremendous opportunity to significantly impact the functionality and pervasiveness of large-area electronics. Commercialization of this technology requires reduction in manufacturing costs by exploiting inexpensive

Characterization of the Latent Image to Developed Image in Model EUV Photoresists

February 22, 2008
Author(s)
John T. Woodward IV, Kwang-Woo Choi, Vivek Prabhu, Shuhui Kang, Kristopher Lavery, Wen-Li Wu, Michael Leeson, Anuja De Silva, Nelson Felix, Christopher K. Ober
Current extreme ultraviolet (EUV) photoresist materials do not yet meet exposure-dose sensitivity, line-width roughness, and resolution requirements. In order to quantify how trade-offs are related to the materials properties of the resist and processing

Non-Brownian Microrheology of a Fluid Gel Interface

February 20, 2008
Author(s)
Erik K. Hobbie, Sheng Lin-Gibson, S K. Kumar
We use stroboscopic video microscopy to study the motion of a sheared fluid-gel interface. External mechanical noise plays a role analogous to temperature, but with a low-frequency breakdown of linear response consistent with an underlying instability. We
Displaying 1326 - 1350 of 1938
Was this page helpful?