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Displaying 1026 - 1050 of 2634

Domain Ordering of Strained 5ML SrTiO 3 Films on Si(001)

June 26, 2007
Author(s)
P Ryan, Joseph Woicik, D Wermeille, J.-W Kim, C S. Hellberg, H Li
We present high resolution X-ray diffraction data indicating regularly ordered square shaped coherent domains approximately 1200A in length co-existing with longer approximately 9500A correlated regions in a highly strained 5ML SrTiO3 (STO) film grown on

High Contrast Scanning Nano-Raman Spectroscopy of Silicon

June 15, 2007
Author(s)
N Lee, R Hartschuh, D Mehtani, A Kisliuk, M D. Foster, Alexei Sokolov, J F. Maguire, Martin L. Green
We have demonstrated that scanning nano-Raman spectroscopy (SNRS), generally known as tip enhanced Raman spectroscopy (TERS), with side illumination optics can be effectively used for analysis of silicon based structures at the nanoscale. Even though the

Margin Failures in Crown-Like Brittle Structures: Off-Axis Loading

June 11, 2007
Author(s)
Chris Ford, T Qasim, M T. Bush, X Z. Hu, Mahek Shah, Vibhu Saxena, Brian R. Lawn
The effect of off-axis loading of compliant indenters on the initiation of cracks at the margins of dental crown-like dome structures consisting of glass shells back-filled with an epoxy resin is examined. As in previous studies on similar structures but
Displaying 1026 - 1050 of 2634
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