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PUBLICATIONS

JCPDS-ICDD Research Associateship (Cooperative Program With NBS/NIST)

Published

Author(s)

Winnie K. Wong-Ng, H F. McMurdie, C R. Hubbard, Alan D. Mighell

Abstract

The Research Associateship Program of the Joint Committee on Powder Diffraction -International Centre for Diffraction Data (JCPDS-ICDD, now known as the ICDD) at NBS/NIST was a long-standing (over 35 years), successful, industry-government cooperation. The main mission of the collaboration was to measure and publish high-quality x-ray powder diffraction reference patterns to be included in the Powder Diffraction File (PDF). The PDF is a continuing compilation of reference patterns used world wide for characterization of crystalline materials. Such reference patterns are gathered from many sources, compiled, edited and published by the ICDD. As a result of this collaboration, more than 1500 high-quality powder diffraction patterns of frequently encountered materials were reported. In addition, various research collaborations with NBS /NIST led to the development of several standard reference materials (SRM) for instrument calibration and quantitative analyses, and computer software for data collection, calibration, reduction, for the editorial process of powder pattern publication, and for quantitative analyses. This article summarizes the JCPDS-ICDD organization, the Powder Diffraction File (PDF), the history and accomplishments of the JCPDS-ICDD Research Associateship, and the present and future collaborations with NIST.
Citation
Journal of Research (NIST JRES) -
Volume
106 No. 6
NIST Pub Series
Journal of Research (NIST JRES)
Pub Type
NIST Pubs

Keywords

CD-ROM data storage, poder data evaluation, Research Associateship, SRMs for powder diffraction, standard powder x-ray diffraction patter
Biomaterials and Ceramics

Citation

Wong-Ng, W. , McMurdie, H. , Hubbard, C. and Mighell, A. (2001), JCPDS-ICDD Research Associateship (Cooperative Program With NBS/NIST), Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed December 12, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 1, 2001, Updated February 19, 2017