U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 60576 - 60600 of 74235

Spin-resolved Superelastic Scattering from Sodium at 10 and 40 eV

December 28, 1991
Author(s)
R E. Scholten, Steven R. Lorentz, Jabez McClelland, Michael H. Kelley, Robert Celotta
Spin-resolved superelastic electron scattering from sodium has been measured at total energies of 10 and 40 eV, for scattering angles between 10° and 140°. The angular momentum transfer, Lperp}, and the spin-resolved components L(Tperp} and L(S)perp} have

Reciprocity Relations for On-Wafer Power Measurements

December 5, 1991
Author(s)
Roger Marks, Dylan F. Williams
The implications of expressions relating the forward and reverse transmission coefficients of a waveguide junction derived from the Lorentz reciprocity condition are explored. The two terms in the relation, the phase of the reference impedance in the guide

Benchmark for the Verification of Microwave CAD Software

December 1, 1991
Author(s)
R. Furlow, R. Y. Shimoda, Dylan Williams, Roger Marks, Kuldip Gupta
A set of microstrip structures which constitute a comprehensive benchmark for the verification of microwave Computer Aided Design (CAD) software has been developed in a collaborative effort. The benchmark is designed to exhibit a wide range of physical

Comparison of On-Wafer Calibrations

December 1, 1991
Author(s)
Dylan F. Williams, Roger Marks, A. Davidson
A powerful new verification technique determines the measurement accuracy of scattering parameter calibrations. The technique determines the relative reference impedance, reference plane offset, and the worst-case measurement deviations of any calibration

Direct Observation of Macroscopic Charge Quantization

December 1, 1991
Author(s)
P Lafarge, H Pothier, Edwin R. Williams, D Esteve, C Urbina, Michel H. Devoret
The circuit formed by a nanoscale tunnel junction in series with a capacitance and a voltage source is the building block of most multi-junction circuits of single electronics. The state of this single electron box is entirely determined by the number n of
Displaying 60576 - 60600 of 74235
Was this page helpful?