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Development of a Testing Methodology to Predict Optical Disk Life Expectancy Values

Published

Author(s)

F L. Podia
Citation
Special Publication (NIST SP) - 500-200
Report Number
500-200

Citation

Podia, F. (1991), Development of a Testing Methodology to Predict Optical Disk Life Expectancy Values, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD (Accessed December 10, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 1, 1991, Updated October 16, 2008