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Scanning Tunneling Microscopy of the Surface Morphology of YBa2Cu3Ox Thin-Films Between 300 K and 76 K

Published

Author(s)

John M. Moreland, Paul Rice, Stephen E. Russek, Blaise Jeanneret, Alexana Roshko, David A. Rudman, Ronald H. Ono
Citation
Applied Physics Letters
Volume
59(23)

Citation

Moreland, J. , Rice, P. , Russek, S. , Jeanneret, B. , Roshko, A. , Rudman, D. and Ono, R. (1991), Scanning Tunneling Microscopy of the Surface Morphology of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>x</sub> Thin-Films Between 300 K and 76 K, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30528 (Accessed November 30, 2022)
Created November 30, 1991, Updated October 12, 2021