U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 56726 - 56750 of 74176

Domain effects in Faraday effect sensors based on iron garnets

February 1, 1995
Author(s)
M. N. Deeter
Domain-induced diffraction effects produced by two iron garnet thick films and two bulk crystals are compared. The thick films, characterized by a serpentine magnetic domain structure, produced nonlinear response functions; this is in qualitative agreement

Fire Performance of an Interstitial Space Construction System (NISTIR 5560)

February 1, 1995
Author(s)
James R. Lawson, E Braun, Laurean A. DeLauter, G Roadarmel
An interstitial space building construction assembly, consisting of a walk-on deck suspended from above by structural steel which also supported a functional floor, reproduce a design planned for use in a new hospital complex at Elmendorf Air Force Base

Interim testing artifact (ITA) : a performance evaluation system for coordinate measuring machines (CMMs) : user manual

February 1, 1995
Author(s)
Amy Singer, J Land, Steven D. Phillips, Daniel S. Sawyer, Bruce R. Borchardt, Gregory W. Caskey, D Ward, P Snoots, B Faust
The Interim Testing Artifact (ITA) is designed to quickly test CMMs for performance problems so that they can be repaired before significant numbers of good parts are erroneously rejected (or bad parts accepted) by the CMM. Frequent testing using the ITA

LRM Probe-Tip Calibrations Using Nonideal Standards

February 1, 1995
Author(s)
Dylan F. Williams, Roger Marks
The line-reflect-match calibration is enhanced to accommodate imperfect match standards and lossy lines typical of monolithic microwave integrated circuits. We characterize the match and line standards using an additional line standard of moderate length

Microform Calibrations in Surface Metrology

February 1, 1995
Author(s)
Jun-Feng Song, F Rudder, Theodore V. Vorburger, A Hartman, Brian R. Scace, J Smith
Microform calibrations include the measurement of complex profile forms and position errors of micrometer scale in combination with the measurement of deviations from a specified profile and surface texture of profile segments. Tolerances on the profile

The Estimation of Measurement Uncertainty of Small Circular Features Measured by CMMs

February 1, 1995
Author(s)
Steven D. Phillips, Bruce R. Borchardt, William T. Estler
This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy, i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point sampling
Displaying 56726 - 56750 of 74176
Was this page helpful?