Schlager, J.
, Jinno, M.
and Franzen, D.
(1995),
Millimeter-Resolution Optical Time-Domain Reflectometry Using a Four Wave Mixing Sampling Gate, IEEE Photonics Technology Letters
(Accessed July 16, 2025)
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Millimeter-Resolution Optical Time-Domain Reflectometry Using a Four Wave Mixing Sampling Gate
Published
Author(s)
, M. Jinno,
Citation
IEEE Photonics Technology Letters
Volume
7
Issue
2
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created January 31, 1995, Updated October 12, 2021