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Displaying 56051 - 56075 of 74359

Heat Release Mechanisms in Inhibited Laminar Counterflow Flames (Journal)

January 1, 1996
Author(s)
Ki Y. Lee, Don J. Cha, Anthony Hamins, I K. Puri
Due to the participation of inhibitors in flame chemistry, it is difficult to concurrently characterize the complex interaction between their cooling action, and the chemical inhibition (which decrease temperature), and their contribution of heat release

Height Calibration of Atomic Force Microscopes Using Silicon Atomic Step Artifacts

January 1, 1996
Author(s)
V W. Tsai, Theodore V. Vorburger, P Sullivan, Ronald G. Dixson, Richard M. Silver, Edwin R. Williams, J Schneir
The decreasing feature dimensions required in the semiconductor manufacturing industry are placing ever increasing demands upon metrology instruments. Atomic force microscopes (AFMs), which can have 1 nm lateral resolution and sub-angstrom vertical

Hierarchical Control in a Virtual Manufacturing Facility

January 1, 1996
Author(s)
Michael Iuliano, Albert W. Jones
Researchers at the National Institute of Standards and Technology are developing a virtual manufacturing cell, which will facilitate standards development and testing. This cell will contain simulation models of a wide range of manufacturing equipment
Displaying 56051 - 56075 of 74359
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