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Displaying 55326 - 55350 of 74459

IGBT Half-Bridge Shoot-Through Characterization for Model Validation

December 31, 1996
Author(s)
David W. Berning, Allen R. Hefner Jr.
A circuit is described for making a variety of measurements on half-bridge Insulated Gate Bipolar Transistor (IGBT) pairs for validating IGBT models. The circuit incorporates two robust isolated gate drives for the IGBTs. Each IGBT is driven with an eight

Z-propagating waveguide lasers in rare-earth-doped Ti:LiNbO 3

December 16, 1996
Author(s)
J. Amin, J. A. Aust, Norman Sanford
A means of reproducibly fabricating stable cw lasers in rare-earth-doped Ti:LiNb0 3 has been demonstrated through judicious choice of waveguide orientation. Z-propagating waveguides have been fabricated in Nd- and Er-diffused Ti:LiNb0 3 and room

Is Your Scanning Electron Microscope Hi-Fi?

December 7, 1996
Author(s)
Andras Vladar, Michael T. Postek, S Davilla
The scanning electron microscope (SEM) historically has been used mainly as an image-producing device and, in spite of certain obvious and sometimes serious electronics problems, serves in this function as an acceptable and effective instrument for many
Displaying 55326 - 55350 of 74459
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