October 12, 2021
Author(s)
L X. Benedict, Eric L. Shirley, T Wethkamp, K Wilmers, C Cobet, N Esser, W Richter, M Cardona
We present measurements and calculations of the dielectric function of wurtzite GaN and AIN. Spectroscopic ellipsometry was used to determine ε (omega) of thin film samples in the energy range from 3 eV to 9.8 eV. Calculations of ε (omega) for the bulk