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Displaying 52726 - 52750 of 74186

New Equations for Water Vapor Pressur in the Temperature Range -100degC to 100degC for use with the 1997 NIST/ASME Steam Tables

February 12, 1998

Author(s)

Peter H. Huang

Performance of a Precision Low Frost-Point Humidity Generator

February 12, 1998

Author(s)

Gregory E. Scace, D C. Hovde, Joseph T. Hodges, Peter H. Huang, J A. Silver, James R. Whetstone

Platinum/Palladium Thin-Film Thermocouples for Temperature Measurements on Silicon Wafers

February 12, 1998

Author(s)

Kenneth G. Kreider, F DiMeo

Raman Microprobe Study of the Visible and Near-Infrared Excited Fluorescence Spectra of Glasses Examined as Potential Raman Intensity Calibration Standards

February 12, 1998

Author(s)

E S. Etz, Steven J. Choquette, Wilbur S. Hurst, Douglas H. Blackburn

The Capsule-Type Standard Platinum Resistance Thermometer as a Standard Reference Material: SRM 1750

February 12, 1998

Author(s)

Weston L. Tew, Gregory F. Strouse

The Evolution of Soot Precursor Particles in a Diffusion Flame

February 12, 1998

Author(s)

R A. Dobbins, Robert A. Fletcher, H -. Chang

The Long Term Calibration Stability of Critical Flow Nozzles and Laminar Flow Meters

February 12, 1998

Author(s)

John D. Wright

A Microcontamination Model for Rotating Disk Chemical Vapor Deposition Reactors

February 11, 1998

Author(s)

R W. Davis, Elizabeth F. Moore, Donald R. Burgess Jr., Michael R. Zachariah

This paper presents preliminary results from a model currently under development for gas-phase generated submicro-size contaminant particles (i.e., microcontaminants) in rotating disk chemical vapor deposition reactors. These particles present a problem

Electrical Optimization of PECVD Chamber Cleaning Plasmas

February 11, 1998

Author(s)

Mark A. Sobolewski, J G. Langan, B S. Felker

Highly Accurate Temperature Measurements with Pure Element Thermocouples

February 11, 1998

Author(s)

Dean C. Ripple, G W. Burns, M Battuello

In-Situ Conductivity Characterization of Oxide Thin Film Growth Phenomena on Microhotplates

February 11, 1998

Author(s)

F DiMeo, Richard E. Cavicchi, Stephen Semancik, John S. Suehle, N H. Tea, John A. Small, J T. Armstrong, J T. Kelliher

Inhibition of Premixed Methane-Air Flames by Fluoroethanes and Fluoropropanes

February 11, 1998

Author(s)

Gregory T. Linteris, Donald R. Burgess Jr., Valeri I. Babushok, Michael R. Zachariah, P R. Westmoreland, Wing Tsang

Measuring the Ion Current in Electrical Discharges using Radio-frequency Current and Voltage Measurements

February 11, 1998

Author(s)

Mark A. Sobolewski

Study of an Underexpanded Annular Wall Jet Past an Axisymmetric Backward-Facing Step

February 11, 1998

Author(s)

Pedro I. Espina, U Piomelli

Analyses of AC Responses in a Surface Confined Redox Process

February 10, 1998

Author(s)

W T. Yap

Analysis of Combustion Particles Contained in Environmental Ice and Snow Samples Using Sublimation in Conjunction with Accelerator Mass Spectrometry and Laser Microprobe Mass Analysis

February 10, 1998

Author(s)

S R. Biegalski, Lloyd A. Currie, Robert A. Fletcher, George A. Klouda, R Weissenbok

Analyzing Mg and Fe in Olivines, Pyroxenes, and Garnets: Systematic Discrepancies

February 10, 1998

Author(s)

Paul Carpenter, J T. Armstrong

Detection and Quantification of Isotopic Ratio Inhomogeneity

February 10, 1998

Author(s)

K Coakley, David S. Simons

Dynamics of the H Atom Abstraction of D Adsorbed on Si(100)

February 10, 1998

Author(s)

Steven A. Buntin

Limits of Analytical Accuracy for Two Critical Semiconductor Systems: (Al,Ga)(As,P) and (In,Ga)(As,P)

February 10, 1998

Author(s)

J T. Armstrong

Multivariate Statistical Analysis of Particle X-Ray Spectra

February 10, 1998

Author(s)

Ian M. Anderson, John A. Small

Mutagenesis by Peroxy Radical is Dominated by Transversions at Deoxyguanosine: Evidence for the Lack of Involvement of 8-oxodG and/or Abasic Formation

February 10, 1998

Author(s)

M R. Valentine, H Rodriguez, J T. Termini

On the Validity of the Poisson Hypothesis for Low-Level Counting: Investigation of the Distribution Characteristics of Background Radiation with the NIST Individual Pulse Counting System

February 10, 1998

Author(s)

Lloyd A. Currie, E M. Eijgenhuijsen, George A. Klouda

Problem Elements and Spectrometry Problems in X-Ray Microanalysis: The Black Holes of the Periodic Table

February 10, 1998

Author(s)

J T. Armstrong

Removing Drift From Scanning Probe Microscope Images of Periodic Samples

February 10, 1998

Author(s)

John T. Woodward IV, D. K. Schwartz

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