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NIST Authors in Bold

Displaying 52351 - 52375 of 74036

Nonlinear Ultrasonic Parameter in Quenched Martensitic Steels

May 1, 1998
Author(s)
Donna C. Hurley, Davor Balzar, P T. Purtscher, K W. Hollman
We have determined the nonlinear ultrasonic parameter Β and the ultrasonic longitudinal phase velocity {upsilion}L for a series of martensitic steel specimens which varied in carbon content.

Photon Physics Home Page

May 1, 1998
Author(s)
Uwe Arp, Charles S. Tarrio
The principal research activities of the Photon Physics Group are in the far ultraviolet and extreme ultraviolet [EUV] physics. In particular, we are currently pursing research activities in EUV optics, the development of x-ray microscopies, and

Physical Aging Behavior in Amorphous Pen Film as Measured by Creep

May 1, 1998
Author(s)
M L. Cerrada, G B. McKenna, J M. O'Reilly, J E. Greene, J R. Gillmor
Characterization of the viscoelastic and aging responses of poly [ethylene naphthalate] [PEN] is of increasing interest as this material begins to see greater use in commercial applications. In typical aging experiments, one quenches the glass transition

Process Specification Language: An Analysis of Existing Representations

May 1, 1998
Author(s)
Amy Knutilla, Craig I. Schlenoff, Steven R. Ray, Stephen T. Polyak, Austin Tate, S C. Cheah, Richard C. Anderson
The goal of the National Institute of Standards and Technology (NIST) Process Specification Language (PSL) project is to investigate and arrive at a neutral, unifying representation of process information to enable sharing of process data among

Sample-Angle Feedback for Diffraction Anomalous Fine-Structure Spectroscopy

May 1, 1998
Author(s)
J O. Cross, W Elam, V G. Harris, J P. Kirkland, Charles E. Bouldin, L B. Sorensen
Diffraction anomalous fine-structure (DAFS) experiments measure Bragg peak intensities as continuous functions of photon energy near a core-level excitation. Measuring the integrated intensity at each energy makes the experiments prohibitively slow

Small-Area Black Luminance Measurements on White Screen Using Replica Masks

May 1, 1998
Author(s)
Paul A. Boynton, Edward F. Kelley
Luminance measurements of small areas of black pixels on white-screen backgrounds are often used as metrics in display measurements, such as character-stroke contrasts or deep modulation transfer functions. Serious errors may be made in measurements and

Trapped Ions, Entanglement, and Quantum Computing

May 1, 1998
Author(s)
C J. Myatt, B E. King, D Kielpinski, Dietrich Leibfried, C S. Turchette, Chris S. Wood, Wayne M. Itano, C Monroe, David J. Wineland
A miniature, elliptical ring rf (Paul) ion trap has been used in recent experiments toward realizing a quantum computer in a trapped ion system. With the combination fo small spatial dimensions and high rf drive potentials, around 500 V amplitude, we have

Ultrasonic Characterization in Advanced Processing of Ceramic Powders

May 1, 1998
Author(s)
Vincent A. Hackley
A world wide web (www) site focussing on NIST efforts in ultrasonic applications development for ceramic processing in fluid-based systems. This site contains information related to facilities, instrumentation, research, and ultrasonic techniques in

Viewing Angle: A Matter of Perspective

May 1, 1998
Author(s)
T. G. Fiske, L. D. Silverstein, C. Penn, Edward F. Kelley
Setting viewing angle requirements and specifications for displays depends on how viewing angle is defined. There is significant confusion in the industry regarding the definition and use of horizontal and vertical viewing angle. Moreover, the relations
Displaying 52351 - 52375 of 74036
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