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Displaying 52326 - 52350 of 74036

Determination of the Seebeck Coefficient of Thin-Film Thermocouples

May 1, 1998
Author(s)
Kenneth G. Kreider, Dean C. Ripple, D P. DeWitt
Thin-film thermocouples have been found useful in numerous applications ranging from thermal convertors, heat flux gages, and thermopiles to surface temperature sensors for turbine engine blades and diesel engine cylinders. Because of their small size

Electrical Linewidth Test Structures Fabricated in Mono-Crystalline Films for Reference-Material Applications

May 1, 1998
Author(s)
Michael W. Cresswell, Richard A. Allen, William F. Guthrie, Rathindra Ghoshtagore, Loren W. Linholm, J. J. Sniegowski
The physical widths of reference features incorporated into electrical linewidth test structures patterned in films of mono-crystalline silicon have been determined from Kelvin voltage measurements. The films in which the test structures are patterned are

Fabrication and Domain Imaging of Iron Magnetic Nanowire Arrays

May 1, 1998
Author(s)
D Tulchinsky, Michael H. Kelley, Jabez J. McClelland, R Gupta, Robert Celotta
Arrays of magnetic nanowires are fabricated by using a corrugated surface, produced by chromium atoms laser-focused in a one-dimensional standing wave, as a shadow mask for an iron evaporator. The deposited iron forms a periodic array consisting of

Flat Panel Display Measurements and Standards

May 1, 1998
Author(s)
Edward F. Kelley
Display metrology is discussed as applied to flat panel displays (FPDs). Topics include the importance of properset up, expected measurement uncertainty vs. repeatability, and problems in making accurage light measurements. The role played by measurement

Infrared Spectroscopic Studies of Wind-Tunnel Contamination

May 1, 1998
Author(s)
Angela R. Hight Walker, David F. Plusquellic, Gerald T. Fraser, A Weber, Walter J. Lafferty
Three infrared diagnostic techniques are developed to characterize chemical contamination in wind tunnels and shock tubes which can affect the reliability of infrared sensor and imaging system tests. The techniques are based on mid-infrared spectroscopy

Kinetically-Controlled Chemical Sensing Using Micromachined Structures

May 1, 1998
Author(s)
Stephen Semancik, Richard E. Cavicchi
Microdevices produced by machining silicon can offer a variety of control functionality on a miniature scale, 1.2 with general advantages connected to not only reduced size (less invasive), but also lower power requirements, lower cost, and reproducibility

Model for Test Method Executive Control Committee (TMECC) Organization and Procedures Part of United States Geological Survey Recognition of Spatial Data Transfer Standard (SDTS) Topological Vector Profile (TVP) Certification System

May 1, 1998
Author(s)
W H. Dashiell, L A. Johnson, Lynne S. Rosenthal
This document describes an overview of the model for United States Geological Survey (USGS) recognition of private sector certification issuing organizations which provide conformance assessment for the SDTS/TV standard.
Displaying 52326 - 52350 of 74036
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