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Displaying 52301 - 52325 of 74036

A Fast Pulse Oscilloscope Calibration System

May 1, 1998
Author(s)
J. P. Deyst, Nicholas Paulter, T. Daboczi, Gerard N. Stenbakken, T. M. Souders
A system is described for calibrating high-bandwidth oscilloscopes using pulse signals. The fast pulse oscilloscope calibration system (FPOCS) is to be used to determine the step response parameters for digitizing oscilloscopes having bandwidths of 20 GHz

A Fast Pulse Oscilloscope Calibration System

May 1, 1998
Author(s)
J. P. Deyst, Nicholas Paulter, T. Daboczi, Gerard N. Stenbakken, T. M. Souders
A system is described for calibrating high-bandwidth oscilloscopes using pulse signals. The fast pulse oscilloscope calibration system (FPOCS) is to be used to determine the step response parameters for digitizing oscilloscopes having bandwidths of 20 GHz

A Nonlinear Fluid Standard Reference Material: Progress Report

May 1, 1998
Author(s)
Carl R. Schultesiz, G B. McKenna
NIST is in the process of developing a new Standard Reference Material that replaces the previous SRM 1490 Nonlinear Fluid Standard. The purpose of the material and its development is two-fold: first, to help equipment manufacturers and researchers in

A Pulse Measurement Intercomparison

May 1, 1998
Author(s)
T. M. Souders, J R. Andrews, A. Caravone, J. P. Deyst, C. Duff, S. Naboicheck
A pulse measurement intercomparison, organized by (NIST) and conducted by the authors in their respective labs, is described. The purpose was to assess the state of the art for time-domain pulse-waveform measurements in the nanosecond regime, and to find

An Infrared Study of H 8 Si 8 O 12 Cluster Adsorption on Si (100) Surfaces

May 1, 1998
Author(s)
J Eng, Krishnan Raghavachari, L M. Struck, Y J. Chabal, B E. Bent, M M. Banaszak-Holl, F R. McFeely, A M. Michaels, G W. Flynn, S B. Christman, E E. Chaban, G P. Williams, K Radermacher, S Mantl
Motivated by an ongoing controversy regarding the proper interpretation of x-ray photoelectron spectra of Si/SiO 2 interfaces derived from the adsorption of H 8Si 8O 12 spherosiloxane clusters on Si(100) surfaces, we have studied the adsorption geometry of

Atomic Hydrogen for the Formation of Abrupt Sb Doping Profiles in MBE-Grown Si

May 1, 1998
Author(s)
P E. Thompson, C Silvestre, M E. Twigg, G Jernigan, David S. Simons
Previously atomic hydrogen has been shown to be effective in reducing the segregation of Ge on Si[100] during solid source molecular beam epitaxygrowth. In this work we have investigated atomic hydrogen to determine if it is equally effective in reducing

Auditory Nerve Fiber Modeling: A Stochastic Melnikov Approach.

May 1, 1998
Author(s)
Marek Franaszek, Emil Simiu
Well-known experiments have established two basic features of auditory nerve fiber dynamics. First, harmonic excitation with constant amplitude produces mean firing rates that are largest for excitation frequencies contained in a relatively narrow best

Characterization of Broad-Band Transmission for Coplanar Waveguides on CMOS Silicon Substrates

May 1, 1998
Author(s)
V. Milanovic, Mehmet Ozgur, Donald C. DeGroot, Jeffrey Jargon, Michael Gaitan, Mona E. Zaghloul
This paper presents characteristics of microwave transmission in coplanar waveguides (CPW's) on silicon (Si) substrates fabricated through commercial CMOS foundries. Due to the CMOS fabrication, the metal strips of the CPW are encapsulated in thin films of

Characterization of Fracture Origins in Advanced Ceramic Materials

May 1, 1998
Author(s)
George D. Quinn, J Swab, E F. Begley
This NIST web site will complement ASTM standard C1322-96, Standard Practice for Fractography and Characterization of Fracture Origins in Advanced Ceramics. The objectives of the web site are to prove a thumbnail sketch of the standard, promote its usage

Code Probability Distributions of A/D Converters with Random Input Noise

May 1, 1998
Author(s)
T. M. Souders
The specific architecture of an A/D converter influences the code probability distributions that result from random input noise. In particular, the ouput codes of successive approximation A/D converters have a spiked distribution, and its variance is half

Code Probability Distributions of A/D Converters with Random Input Noise

May 1, 1998
Author(s)
T. M. Souders
The specific architecture of an A/D converter influences the code probability distributions that result from random input noise. In particular, the ouput codes of successive approximation A/D converters have a spiked distribution, and its variance is half

Connection Model for the Seismic Analysis of Welded Steel Moment Frames.

May 1, 1998
Author(s)
John L. Gross
An analytical approach is described for performing seismic evaluation of welded steel moment frame buildings constructed prior to the 1994 Northridge earthquake. The approach is based on an analytical model that captures the possibility of connection

Criteria for United States Geological Survey (USGS) Recognizing Testing Laboratory/ies Functions and Requirements Part of United States Geological Survey Recognition of Spatial Data Transfer Standard (SDTS) Topological Vector Profile (TVP) Certification

May 1, 1998
Author(s)
W H. Dashiell, L A. Johnson, Lynne S. Rosenthal
This document describes an overview of the model for United States Geological Survey (USGS) recognition of private sector Certification Issuing Organizations which provide conformance assessment for the SDTS/TV standard.

Cure, Shrinkage and Properties of an Epoxy Material

May 1, 1998
Author(s)
O Sindt, S L. Simon, G B. McKenna, E Liang
This work focuses on obtaining data to perform realistic finite element models of residual stresses in composite parts made of toughened epoxy thermosets. The initial thrust of the work is aimed at studying the volumetric behavior before, during, and after
Displaying 52301 - 52325 of 74036
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