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Application of Microcalorimeter EDS X-Ray Detectors to Particle Analysis

Published

Author(s)

Alain C. Diebold, David A. Wollman, Kent D. Irwin, John M. Martinis, B. H. Liu
Proceedings Title
Proc., Fourth Intl. Symp. on Ultra Clean Processing of Silicon Surfaces (UCPSS'98)
Conference Dates
September 21-23, 2098
Conference Location
Ostend, 1, SW

Citation

Diebold, A. , Wollman, D. , Irwin, K. , Martinis, J. and Liu, B. (1998), Application of Microcalorimeter EDS X-Ray Detectors to Particle Analysis, Proc., Fourth Intl. Symp. on Ultra Clean Processing of Silicon Surfaces (UCPSS'98), Ostend, 1, SW (Accessed April 19, 2024)
Created August 31, 1998, Updated October 12, 2021