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Efficient Testing of Electronic Devices

Published

Author(s)

T. M. Souders, Gerard N. Stenbakken, Hans Engler
Proceedings Title
Computing Science and Statistics - Mining and Modeling massive Data Sets in Science, Engineering, and Business with a Subtheme in Environmental Statistics
Volume
29
Issue
1
Conference Location
Houston, TX, USA
Conference Title
Proc. of the 29th Symposium on the Interface

Citation

Souders, T. , Stenbakken, G. and Engler, H. (1998), Efficient Testing of Electronic Devices, Computing Science and Statistics - Mining and Modeling massive Data Sets in Science, Engineering, and Business with a Subtheme in Environmental Statistics, Houston, TX, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32677 (Accessed February 23, 2024)
Created August 31, 1998, Updated October 12, 2021