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Displaying 50501 - 50525 of 74335

Detection of p53 Gene Mutation: Analysis by Single-Strand Conformation Polymorphism and Cleavase Fragment Length Polymorphism

June 1, 1999
Author(s)
C D. O'Connell, Donald H. Atha, M C. Oldenburg, J Tian, M Siebert, D Handrow, K Grooms, L Heisler, M de Arruda
We have generated a collection of clones containing single point mutations within the exon 5-9 hot spot regions of the p53 gene by using polymerase chain reaction (PCR) to amplify select regions of the gene from characterized cell lines. These clones were

Dimensional Metrology with the NIST Calibrated Atomic Force Microscope

June 1, 1999
Author(s)
Ronald G. Dixson, R Koning, V W. Tsai, Joseph Fu, Theodore V. Vorburger
Atomic force microscopes (AFMs) are increasingly used in the semiconductor industry as tools for submicrometer dimensional metrology. The scales of an AFM must be calibrated in order to perform accurate measurements. We have designed and developed the

Dynamic Contact Angle of a Liquid Spreading on a Heated Plate

June 1, 1999
Author(s)
Dean C. Ripple
An equation determining the steady-state profile of a liquid meniscus advancing or receding across a heated plate is derived. The effects of liquid evaporation, intermolecular interaction with the plate, and thermocapillarity are included. Numerical and

Dynamic Partitioning of Neutral Polymers into a Single Ion Channel

June 1, 1999
Author(s)
S. M. Bezrukov, John J. Kasianowicz
Polymers partitioning into highly confined spaces can be studied using single nanometer-scale pores formed by protein ion channels. The ionic conductance of a channel depends on the state of occupancy of the pore by polymer and serves as a measure of

Electrostriction of Near-Critical SF 6 in Microgravity

June 1, 1999
Author(s)
G A. Zimmerli, R A. Wilkinson, R A. Ferrell, Michael R. Moldover
We used interferometry to measure the electric-field-induced (I.e., electrostrictive) increase of the density of sulfur hexafluoride near its critical point. The results at the temperatures T c + 5 mK, T c + 10 mK, and T c + 30 mK, with T c = 319 K, agree

Embedded Systems, The Forgotten Y2K Problem

June 1, 1999
Author(s)
G E. Fisher
Much has been written about embedded systems and how they will be affected by the year 2000 problem. During the first 6 months of 1999, a significant amount of conflicting information was spread about the outlook for fixing systems that rely on embedded

Grain Boundary Crack Growth in Interconnects With an Electric Current

June 1, 1999
Author(s)
C Y. Liu, S K. Lee, Tze J. Chuang
Failure of thin-film interconnects poses a great concern in semiconductor devices. Due to the high electric current density in interconnects, electromigration-induced atomic flux is recognized as an important failure mechanisms. For wide polycrystalline

Gray Calibration of Digital Cameras to Meet NIST Mugshot Best Practice

June 1, 1999
Author(s)
M Rubinfeld, Charles L. Wilson
A primary objective of any process of photography, electronic publishing, or printing is to reproduce all colors as perfectly as possible. A good starting point is to render a series of known shades of gray as accurately as possible. The goal of this

Interactions Between Bicrystal Josephson Junctions in a Multilayer Structure

June 1, 1999
Author(s)
H. Q. Li, Ronald H. Ono, Leila R. Vale, David A. Rudman, Sy-Hwang Liou
We have fabricated and studied a variety of devices based on stacked Yba 2Cu 3O x bicrystal Josephson junctions in a multilayer structure. The proximity of the junctions in the two layers produces a large number of effects based on interactions between the

Intercomparison of SEM, AFM, and Electrical Linewidths

June 1, 1999
Author(s)
John S. Villarrubia, Ronald G. Dixson, Samuel N. Jones, J R. Lowney, Michael T. Postek, Richard A. Allen, Michael W. Cresswell
Uncertainty in the locations of line edges dominates the uncertainty budget for high quality sub-micrometer linewidth measurements. For microscopic techniques like scanning electron microscopy (SEM) and atomic force microscopy (AFM), the image of the sharp

Internet-based Distributed Measurement and Control Applications

June 1, 1999
Author(s)
Kang B. Lee, Richard D. Schneeman
This paper describes research and development work conducted at the National Institute of Standards and Technology (NIST) on an Internet-based Distributed Measurement and Control (DMC) system. The work has resulted in applications that highlight state-of

Isochoric Heat Capacity Measurements for Binary Refrigerant Mixtures Containing Difluoromethane (R32), Pentafluoroethane (R125), 1,1,1,2-Tetrafluoroethane (R134a), and Trifluoroethane (R143a) From 200 to 345 K at Pressures ato 35 Mpa

June 1, 1999
Author(s)
Joe W. Magee
Molar heat capacities at constant volume C v were measured for binary refrigerant mixtures with an adiabatic colorimeter with gravimetric determinations of the amount of substance. Temperatures ranged from 200 to 345 K, while pressures extended up to 35

Isochoric p-rho-T and Heat Capacity Cv Measurements for Ternary Refrigerant Mixtures Containing Difluoromethane (R32), Pentafluoroethane (R125), and 1,1,1,2-Tetrafluoroethane (R134a) From 200 to 400 at Pressures to 35 MPa

June 1, 1999
Author(s)
Joe W. Magee
The p-p-T relationships and constant volume heat capacity C υ were measured fro ternary refrigerant mixtures by isochoric methods with gravimetric determinations of the amount of substance. Temperatures ranged from 200 to 400 K for p-p-T and from 203 to

Just How Perfect Can a Perfect Crystal Be?

June 1, 1999
Author(s)
R Deslattes, Ernest G. Kessler, S M. Owens, David R. Black, Albert Henins
This overview addresses certain aspects of the perfection of the current generation of commercially manufactured silicon, specifically lattice uniformity and the more complex issues of interstitials, vacancies, and chemical impurities. The application

Large Area YBa 2 Cu 3 O 7-x Bolometers on Si Substrates

June 1, 1999
Author(s)
Leila R. Vale, Ronald H. Ono, Donald G. McDonald, Robert J. Phelan
We have developed YBa 2Cu 3O 7-x (YBCO) thermometers for large-area (4 mm x 4 mm) electrical substitution bolometers. We passivated the YBCO with a thin Au layer and demonstrated a noise equivalent temperature of 4 nK Hz -1/2. We then used a resistor layer
Displaying 50501 - 50525 of 74335
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