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Microscopic Image Analysis of Defect Areas in Optical Disks

Published

Author(s)

P L'Hostis, Frederick R. Byers, Fernando L. Podio, Xiao Tang

Abstract

This paper presents techniques developed in the Information Technology Laboratory of the US National Institute of Standards and Technology (NIST/ITL) for enabling microscopic image analysis of optical data storage media such as optical discs. These non-destructive techniques allow investigators to easily locate on the disc a predetermined series of media defects. The techniques can be applied to any type of optical disks including CDs and DVDs. The paper describes the experimental setup and the techniques utilized to achieve localization and registration of media defects. These techniques include data acquisition, computer control, auto focus, image processing, and remote control and observation. An extension of this setup utilizing available graphical programming environments can allow investigators at different locations to share and discuss the information of media defects by use of the Internet.
Citation
SPIE International Society for Optical Engineering
Volume
3806

Keywords

CD, data storage, DVD, media defects analysis, microscopic defect analysis, microscopic image processing, optical disks measurements

Citation

L'Hostis, P. , Byers, F. , Podio, F. and Tang, X. (1999), Microscopic Image Analysis of Defect Areas in Optical Disks, SPIE International Society for Optical Engineering, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=151442 (Accessed June 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 30, 1999, Updated October 12, 2021