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Search Publications

NIST Authors in Bold

Displaying 50251 - 50275 of 73697

Microstructural Changes in YSZ Deposits During Annealing

March 1, 1999
Author(s)
Andrew J. Allen, J Ilavsky, Gabrielle G. Long, Jay S. Wallace, C C. Berndt, H Herman
Various methods have been applied to the microstructural characterization of thermally-sprayed depostis. However, coexisting anisotropic distributions of intra-splat cracks and interlamellar pores, and the broad size range of rounded globular pores, have

Minimizing Feature Width in Atom-Optically Fabricated Chromium Nanostructures

March 1, 1999
Author(s)
W Anderson, C Bradley, Jabez J. McClelland, Robert Celotta
We present a study of factors that influence the feature width of nanostructures formed by atom-optical direct-write lithography. In this process, chromium atoms travel through a standing-wave laser light field and are deposited on a surface. Due to the

Molecularly Dispersed Dendrimers in a Polymeric Matrix

March 1, 1999
Author(s)
Barry J. Bauer, T J. Prosa, D W. Liu, C L. Jackson, D A. Tomalia, Eric J. Amis
Interpenetrating polymer networks are formed by dissolving poly(amidoamine) dendrimers in 2-hydroxyethyl methacrylate and polymerizing with dendrimer contents between 1 and 25 mass % containing dendrimers from generation 6 through 11. Small angle x-ray

Myths About Building Envelopes

March 1, 1999
Author(s)
Andrew K. Persily
It is often assumed that commercial and institutional buildings are fairly airtight and that envelopee air leakage does not have a significant impact on energy consumption and indoor air quality in these buildings. Furthermore, it is assumed that more

Optical Linewidth Models - Then and Now

March 1, 1999
Author(s)
Robert D. Larrabee, Richard M. Silver, M P. Davidson
In the late 1970's Dr. Diana Nyyssonen demonstrated that the National Institute of Standards and Technology (NIST) could optically calibrate photomask linewidth standards that were narrower than the classical resolution limit of a conventional bright-field

Rectification in Quantum Hall Effect Devices Above Breakdown

March 1, 1999
Author(s)
Kevin C. Lee
Three-terminal contract resistances of 180 contacts on 15 quantum Hall effect (QHE) devices were measured as a function of current at the center of the I = 4 plateau at temperatures between 1.1 K and 1.4 K. For current densities less than about 1.5 A/m

Results and Challenges in Web Search Evaluation

March 1, 1999
Author(s)
D Hawking, Nick Craswell, P Thistlewaite, Donna Harman
A frozen 18.5 million page snapshot of part of the Web has been created to enable and encourage meaningful and reproducible evaluation of Web search systems and techniques. This collection is being used in an evaluation framework within the Text Retrieval

Simulation and Performance Study of PNNI ATM Networks

March 1, 1999
Author(s)
Y M. Song, David E. Cypher, David H. Su
This paper presents the simulation and performance of PNNI ATM networks by using an ATM PNNI Routing Protocol Simulator (APRoPS). This simulator was developed based on the ATM Forum s PNNI routing protocol specification. With this simulator, one can design

Stable Quasicrystalline Sphere Packing

March 1, 1999
Author(s)
Eric J. Cockayne, M Mihalkovic
Wills (1990, J. Phys., Paris 51, 1061), found a method relating certain decagonal disk packings to decagonal sphere packings with high packing fractions. Applying this technique to the decagonal rectangle-triangle tiling generated by inflation, we obtain a

Strain Measurements in A Thermally-Cycled Flip-Chip PBGA Solderball

March 1, 1999
Author(s)
Elizabeth S. Drexler
The mismatch between the coefficients of thermal expansion of the silicon chip and the organic substrate has been mitigated through the practice of using underfill in flip-chip packages. Yet solder fatigue and package failures still occur. This is

Structural and Magnetic Properties of Electrodeposited Co/Cu Multilayers

March 1, 1999
Author(s)
M Shima, L Salamanca-Riba, Thomas P. Moffat, Robert D. McMichael
A series of [Co(x ML)/Cu(17 ML)]100 multilayers were electrodeposited on Si(0 0 1) substrates covered with Cu seed layers. Magnetic hysteresis loops for lms with x 2 ML have sigmoidal shapes and the temperature dependence indicates a superparamagnetic

Summary of ISO/TC 201 Standards: Introduction

March 1, 1999
Author(s)
Cedric J. Powell, R Shimizu
An introduction is given to a planned series of short summaries of international standards developed by Technical Committee 201 on Surface ChemicalAnalysis of the International Organization for Standardization (ISO). The purpose of these summaries is to
Displaying 50251 - 50275 of 73697
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