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NIST Authors in Bold

Displaying 48801 - 48825 of 73970

Gate Dielectric Thickness Metrology Using Transmission Electron Microscopy

January 1, 2000
Author(s)
J H. Scott, Eric S. Windsor, D Brady, J Canterbury, A. Karamcheti, W Chism, A C. Diebold
Silicon Oxynitride blanket films approximately 2 n min thickness are characterized in cross section using a 300 keV TEM/STEM. High resolution imaging is used to investigate the accuracy and precision of TEM film thickness measurements and their

Generating Solitons by Phase Engineering of a Bose-Einstein Condensate

January 1, 2000
Author(s)
J Denschlag, J E. Simsarian, D L. Feder, Charles W. Clark, L A. Collins, J Cubizolles, Lu Deng, Edward W. Hagley, Kristian Helmerson, W P. Reinhardt, S L. Rolston, B I. Schneider, William D. Phillips
We demonstrate quantum phase engineering using two novel techniques that allow us to write and read the spatial phase of a Bose-Einstein condensate (BEC). We design and produce a quantum state by optically imprinting phasepatterns onto a condensate of

Growth & Magnetic Oscillatory Exchange Coupling of Mn/Fe (001) and Fe/Mn/Fe (001)

January 1, 2000
Author(s)
D Tulchinsky, John Unguris, Robert Celotta
The magnetic ordering and the interlayer exchange coupling in Mn and Fe/Mn wedge structures grown epitaxially on Fe(001) whisker substrates were investigated using scanning electron microscopy with polarization analysis (SEMPA). In bare Mn/Fe(001) samples

H. H. Ku, 1918-1999

January 1, 2000
Author(s)
C M. Croarkin, Joan R. Rosenblatt
A short obituary article on Hsien Hsiang (Harry) Ku, former Chief of the Statistical Engineering Division at the National Institute of Standards and Technology (NIST), who died of cancer on June 4, 1999, at his home in Kensington, MD.

High Resolution g-Ray Spectroscopy: the First 85 Years

January 1, 2000
Author(s)
R Deslattes
This opening review attempts to follow the main trends in crystal diffraction spectrometry of nuclear γ-rays from its 1914 beginning in Rutherford's laboratory to the ultra-high resolution instrumentation realized in the current generation of spectrometers

High-Speed Machining Frequency Response Prediction for Process Optimization

January 1, 2000
Author(s)
Tony L. Schmitz, Matthew A. Davies, Michael Kennedy
As interest in high-speed machining techniques grows among world manufacturers, efficient methods for obtaining the tool point frequency response (used as input to analytic or numerical chatter prediction/avoidance models) become more important. We

Hsien Hsiang Ku - Obituary

January 1, 2000
Author(s)
C M. Croarkin, Joan R. Rosenblatt
A short obituary article on Hsien Hsiang (Harry) Ku, former Chief of the Statistical Engineering Division at the National Institute of Standards and Technology (NIST), who died of cancer on June 4, 1999, at his home in Kensington, MD.
Displaying 48801 - 48825 of 73970
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