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Displaying 48801 - 48825 of 73830

Nanoindentation of Polymers: Tip Shape Calibration and Uncertainty Issues

January 1, 2000
Author(s)
Mark R. VanLandingham, John S. Villarrubia, G Meyers
Indentation measurements made with atomic force microscopy (AFM) probes are relative measurements, largely due to the lack of information regarding the tip shape of the AFM probes. Also, current tip shape calibration procedures used in depth-sensing

Nanosecond Magnetization Reversal in High Coercivity Thin Films

January 1, 2000
Author(s)
N D. Rizzo, Thomas J. Silva, Anthony B. Kos
We used a wide-field Kerr microscope to measure magnetization reversal in high coercivity thin film media that were subjected to nanosecond field pulses. Coplanar waveguides were used as a field source. Two different samples of CoCr 10Ta 4 were measured

Networking of Welding Applications: A Tutorial - Knowing the Basics Behind Network Technology Will Help Users of Welding Equipment Identify Where Networks May Be Most Beneficial

January 1, 2000
Author(s)
William G. Rippey, James D. Gilsinn, L Flitter
This article describes the basics of network technology and how networks are being applied to commercial welding applications. The goal is to help non-computer-expert weld technology users to decide where products that use networks may be beneficial, and

New Developments in Deep Ultraviolet Laser Metrology for Photolithography

January 1, 2000
Author(s)
Marla L. Dowell, Christopher L. Cromer, Richard D. Jones, Darryl A. Keenan, Thomas Scott
Current and future laser measurement services at 157, 193, and 248 nm will be reviewed. Laser power and energy measurements at 193 nm will be presented, electrical calibration issues will be reviewed. We report an overall calibration uncertainty of laser

New Limit on the D Coefficient in Polarized Neutron Decay

January 1, 2000
Author(s)
L Lising, S R. Hwang, J M. Adams, T J. Bowles, M C. Browne, T E. Chupp, K A. Coulterpark, Maynard S. Dewey, S J. Freedman, B K. Fujikawa, A Garcia, G L. Greene, G L. Jones, Hans P. Mumm, Jeffrey S. Nico, J M. Richardson, R G. Robertson, W A. Teasdale, Alan K. Thompson, E G. Wasserman, Fred E. Wietfeldt, R C. Welsh, J F. Wilkerson

NIST artifact standards for fiber optic metrology

January 1, 2000
Author(s)
Paul A. Williams
The primary means of transferring fiber optic calibration metrology at the National Institute of Standards and Technology is through artifact standards called Standard Reference Materials (SRM). NIST currently provides SRMs for fiber geometry (fiber

NIST Atomic Spectra Database

January 1, 2000
Author(s)
Yuri Ralchenko, Jeffrey R. Fuhr, F -. Jou, Alexander Kramida, William C. Martin, Larissa Podobedova, Joseph Reader, Edward B. Saloman, Jean E. Sansonetti, Wolfgang L. Wiese
Displaying 48801 - 48825 of 73830
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