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A statistical test suite for random and pseudorandom number generators for cryptographic applications:

Published

Author(s)

Andrew Rukhin, Juan Sota, James Nechvatal, Miles Smid, Elaine Barker, Stefan Leigh, Mark Levenson, Mark Vangel, David Banks, Alan Heckert, James Dray, San Vo
Citation
- NIST SP 800-22
Report Number
NIST SP 800-22

Citation

Rukhin, A. , Sota, J. , Nechvatal, J. , Smid, M. , Barker, E. , Leigh, S. , Levenson, M. , Vangel, M. , Banks, D. , Heckert, A. , Dray, J. and Vo, S. (2000), A statistical test suite for random and pseudorandom number generators for cryptographic applications:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.800-22 (Accessed June 17, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 2000, Updated May 20, 2023