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A Microwave Frequency Reference Based on VCSEL-Driven Dark Line Resonances in Cs Vapor

Published

Author(s)

John E. Kitching, N Vukicevic, Leo W. Hollberg, Svenja A. Knappe, C Affolderbach, R. Wynands, W Weidemann
Proceedings Title
Intl. IEEE Freq. Cont. Symp.
Conference Dates
June 6-9, 2000
Conference Location
Kansas City, MO
Conference Title
Proc. Intl. IEEE Freq. Cont. Symp.

Citation

Kitching, J. , Vukicevic, N. , Hollberg, L. , Knappe, S. , Affolderbach, C. , Wynands, R. and Weidemann, W. (2000), A Microwave Frequency Reference Based on VCSEL-Driven Dark Line Resonances in Cs Vapor, Intl. IEEE Freq. Cont. Symp. , Kansas City, MO, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=105348 (Accessed November 12, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 2000, Updated February 17, 2017