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Displaying 47776 - 47800 of 143780

MEASUREMENT OF WEIGHTED LED RADIANCE RELATED TO PHOTOBIOLOGICAL SAFETY

December 1, 2010
Author(s)
Tongsheng Mou, Yuqin Zong, Yoshi Ohno
Optical radiation safety of light-emitting diode (LED) products is being addressed in the International Electrotechnical Commission (IEC) standard document 62471-2006. Measurement of weighted radiance of LEDs, used to assess the maximal exposure related to

Modeling Smoldering Fires using the Computer Model CONTAM

December 1, 2010
Author(s)
William D. Davis
The computer model CONTAM was used to simulate the spread of smoke in a house with a working furnace during smoldering fires. Three smoldering experiments from a study on detector sensitivity and siting requirements conducted in 1975 using a two story

SANS from Pluronic P85 in d-water

December 1, 2010
Author(s)
Boualem Hammouda
Small-angle neutron scattering (SANS) has been used to investigate pluronic P85 (EO 26PO 40EO 26) copolymer in deuterated water. A range of P85 fractions were measured for a wide sample temperature window. A rich phase behavior is reported. Unimers were

The Effect of Substrate Material on Silver Nanoparticle Antimicrobial Efficacy

December 1, 2010
Author(s)
Benita Dair, Dave M. Saylor, T. E. Cargal, Grace R. French, Kristen M. Kennedy, Rachel S. Casas, Jonathan E. Guyer, James A. Warren, Steven K. Pollack
With the advent of Nanotechnology, silver nanoparticles increasingly are being used in coatings, especially in medical device applications, to capitalize on their antimicrobial properties. The increased antimicrobial efficacy of nanoparticulate silver

The Role of High-Field Stress in the Negative Bias Temperature Instability

December 1, 2010
Author(s)
Jason P. Campbell, Kin P. Cheung, John S. Suehle, A Oates
In this study, a fast drain current measurement methodology which supports the standard threshold voltage and transconductance extractions associated with the fast dynamic negative-bias temperature instability (NBTI) is presented. Using this methodology

US Anti-Counterfeiting Standards Development Activities: An Overview

December 1, 2010
Author(s)
Yaw S. Obeng, Eric D. Simmon, YaShian Li-Baboud
Counterfeit electronics components impact performance, hence can be viewed as a reliability concern. Several different strategies have been proposed to mitigate the penetration and impact of counterfeits on the supply chain. Standards afford effective
Displaying 47776 - 47800 of 143780
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