NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 47076 - 47100 of 73697

Antenna Range Imaging

October 1, 2000
Author(s)
Ronald C. Wittmann, Michael H. Francis
We present a preliminary evaluation of a microwave measurement system that has been designed to determine electromagnetic fields in the quiet-zone of an antenna measurement range and to produce an image of the sources, intended and unintended, of the

BLCC-NIST Building Life-Cycle Cost Program, Version 5.0

October 1, 2000
Author(s)
S Fuller, A Boyles, Bruce R. Miller
The BLCC5 Building Life-Cycle Cost Program provides economic analysis of projects for which both initial capital costs and future operational costs need to be considered. The program is useful for evaluating the long-term costs and savings of energy and

Chain Dimensions in Polysilicate-Filled Poly(Dimethyl Siloxane)

October 1, 2000
Author(s)
A Nakatani, W Chen, R G. Schmidt, G V. Gordon, Charles C. Han
We present experimental results on the single chain dimensions of isotopic blends (both mismatched and matched molecular masses) of poly(dimethyl siloxane) (PDMS) containing trimethylsilyl-treated polysilicate particles (fillers) and compare these results

Chemical Imaging With Scanning Near-Field Infrared Microscopy and Spectroscopy

October 1, 2000
Author(s)
Chris A. Michaels, Lee J. Richter, Richard R. Cavanagh, Stephan J. Stranick
The development of a scanning near-field microscope that utilizes infrared absorption as the optical contrast mechanism is described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of

Coding and Modulation for LMDS and Analysis of the LMDS Channel

October 1, 2000
Author(s)
J E. Hakegard
During the last two to three years, there has been considerable activity aimed towards deploying broadband wireless access systems. The U. S. Local Multipoint Distribution Services (LMDS) auctions in February-March 1998 of 1.3 GHz of spectrum between 27.5

Cold Collision Frequency Shifts in a 87 Rb Atomic Fountain

October 1, 2000
Author(s)
Y Sortais, S Bize, C Nicolas, A Clairon, C Salomon, C Williams
We present measurements of cavity frequency pulling and collisional frequency shifts in a 87Rb fountain with a frequency resolution of 3 x 10 -16. Agreement with theory is found for the cavity pulling and the measured collisional shifts. The clock shift is

Color Issues of White LEDs

October 1, 2000
Author(s)
Yoshihiro Ohno
For white LEDs to be used for general lighting, they should have appropriate white color and good color rendering performance for illuminated objects. Color rendering, as well as energy efficiency (efficacy), have been the two most important criteria for

Comparison of Optical-Power Meters Between the NIST and the PTB

October 1, 2000
Author(s)
Igor Vayshenker, Holger Haars, John H. Lehman, David J. Livigni
We describe the results of a comparison of optical-power meters undertaken by the National Institute of Standards and Technology (NIST, USA) and the Physikalisch-Technische Bundesanstalt (PTB, Germany) at nominal wavelengths of 1300 nm and 1550 nm. Both

Comparison of Reference Standards for Measurements of Optical-Fibre Power

October 1, 2000
Author(s)
S. V. Tikhomirov, A. I. Glazov, M. L. Kozatchenco, V. E. Kravtsov, A. B. Svetlichny, Igor Vayshenker, Thomas Scott, Douglas L. Franzen
National reference standards for determining optical-fibre power maintained by the National Institute of Standards and Technology (NIST, USA) and the All-Russian Research Institute for Optophysical Measurements (VNIIOFI, Russian Federation) were compared

Contact-Pad Design for High-Frequency Silicon Measurements

October 1, 2000
Author(s)
Dylan Williams, A. C. Byers, V. C. Tyree, Dave K. Walker, J. J. Ou, X. Jin, M. Piket-Moy, C. Hu
We measure and compare the electrical parasitics of contact pads of different designs fabricated on silicon integrated circuits and develop a strategy for reducing the parasitics.

Continuous Wave Laser Radiometry Project

October 1, 2000
Author(s)
Daryl Myers, Christopher L. Cromer
The objective of the Continuous Wave (CW) Laser Radiometry project is to develop measurement methods and standards for characterizing laser sources and detectors used primarily with CW radiation. The project will develop and maintain measurement services

Detection of the BCS Transition of a Trapped Fermi-Gas

October 1, 2000
Author(s)
G M. Bruun, Charles W. Clark
We investigate theoretically the properties of a trapped gas of fermionic atoms both in the normal and the superfluid phase. A detailed analysis including the shell structure of the normal phase spectrum exactly, leads to the proposal of two observables

Development of a Linear Motor Drive Testbed and Initial Thermal Behavior Results

October 1, 2000
Author(s)
Kari K. Harper, Bradley N. Damazo, M A. Donmez
The machine tool industry is moving toward using linear motors for both conventional and high speed machine tools due to many advantages: low maintenance, faster assembly times (compared with the more conventional ball screw drives), and improvements in

Dimensional Metrology of Millimeter- and Sub-millimeter-scale Components

October 1, 2000
Author(s)
Theodore V. Vorburger, Jun-Feng Song, Joseph Fu, M Tundermann, Thomas Brian Renegar, Theodore D. Doiron, N G. Orji
Decreasing sizes and tolerances of engineering components bring a demand for decreasing uncertainty in the dimensional measurements of these parts. Hence there is increasing need for measuring machines capable of performing dimensional and geometrical
Displaying 47076 - 47100 of 73697
Was this page helpful?