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Displaying 46051 - 46075 of 74220

Highly Charged Ions

January 1, 2001
Author(s)
John D. Gillaspy
This article reviews some of the fundamental properties of highly charged ions, the methods of producing them (with particular emphasis on table-top devices), and their use as a tool for both basic science and applied technology. Topics discussed include

Improving High-Speed Machining Material Removal Rates by Rapid Dynamic Analysis

January 1, 2001
Author(s)
Tony L. Schmitz, Matthew A. Davies, Kate Medicus
Stability prediction and chatter avoidance in high-speed machining requires knowledge of the tool point dynamics. In this paper, three advances toward the rapid identification of the tool point frequency response and corresponding stable cutting parameters

In Situ Imaging of Highly Charged Ion Irradiated Mica

January 1, 2001
Author(s)
L P. Ratliff, John D. Gillaspy
We have studied the modification of mica surfaces due to the impact of Xe44+ ions by imaging the ion-exposed surfaces with atomic force microscopy in vacuum. By incorporating the microscope into the vacuum chamber where the samples are exposed to the ions

Influence of Crack Path on Crack Resistance of Brittle Matrix Composites

January 1, 2001
Author(s)
S Wu, D Patterson, M Ferber, Lin-Sien H. Lum
Studies on particulate reinforced ceramic composites, mainly glass/Al 2O 3, have shown pronounced crack path variations with variations in microstructure and loading rate. The variations in path strongly influenced the crack resistance of the composite

Information Technology Measurement and Testing Activities at NIST

January 1, 2001
Author(s)
Michael D. Hogan, Lisa J. Carnahan, Robert J. Carpenter, David W. Flater, James E. Fowler, Simon P. Frechette, M M. Gray, L A. Johnson, R. McCabe, Douglas C. Montgomery, Shirley M. Radack, R Rosenthal, Craig M. Shakarji
Our high technology society continues to rely more and more upon sophisticated measurements, technical standards, and associated testing activities. This was true for the industrial society of the 20th century and remains true for the information society

Infrared Spectra of Ne, Kr, and Xe

January 1, 2001
Author(s)
Craig J. Sansonetti, M M. Blackwell, Edward B. Saloman
New observations of the spectra of neutral Ne, Kr, and Xe in the region 0.7 to 5.0 m with the 2-m NIST FTS provide precise new wavelengths and resolve questions concerning lines that were previously multiply classified.
Displaying 46051 - 46075 of 74220