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Displaying 45301 - 45325 of 73960

Publication and Use of Large Data Sets

August 1, 2001
Author(s)
J R. Rumble
Scientific information comes in many sizes, types and quality. Because of diversity of the scientific information being published, different issues will arise in publishing different types of information electronically. In this paper, we will address

Quantum Electrodynamics in the Dark

August 1, 2001
Author(s)
John D. Gillaspy
Perhaps they're just shy, but heavy atoms seem very uncomfortalbe when most of their electrons are stripped off. In order to cover their nakedness as quickly as possible, they aggressively try to steal electrons from any source they encounter. Their

Radiometry of Low-Pressure Hg-Ar Discharges

August 1, 2001
Author(s)
Craig J. Sansonetti, Joseph Reader
New fluorescent lamp designs employ Hg-Ar discharges under operating conditions that differ significantly from those found in conventional fluorescent tubes. We have studied the radiant output of Hg-Ar discharges over a wide range of Ar pressure, Hg vapor

Raman and FTIR Spectroscopies of Fluorescein in Solutions

August 1, 2001
Author(s)
Lili Wang, A. E. Roitberg, Curtis W. Meuse, Adolfas K. Gaigalas
Raman and FTIR transform-infra red (FT-IR) spectroscopies of fluorescein in aqueous solutions have been investigated in the pH range from 9.1 to 5.4. At pH 9.1 fluorescein is in the dianion form. At pH 5.4, fluorescein is a mixture of monoanion (

Reference Material 8091: New Scanning Electron Microscope Sharpness Standard

August 1, 2001
Author(s)
Andras Vladar, Michael T. Postek, Nien F. Zhang, Robert D. Larrabee, Samuel N. Jones, Russell E. Hajdaj
All scanning electron microscope-based inspection instruments, whether they are in a laboratory or on the production line, slowly lose their performance and then the instrument is no longer capable of providing as good quality, sharp images as before. This

Reference Material 8091: New Scanning Electron Microscope Sharpness Standard

August 1, 2001
Author(s)
Andras Vladar, Michael T. Postek, Nien F. Zhang, Robert D. Larrabee, Samuel N. Jones, Russell E. Hajdaj
Reference Material (RM 8091) is intended primarily for use in checking the sharpness performance of scanning electron microscopes. It is supplied as a small, approximately 2 mm x 2 mm diced semiconductor chip. This sample is capable of being mounted

Reference Minerals for Microanlaysis of Light Elements

August 1, 2001
Author(s)
M D. Dyar, M Wiedenbeck, D Robertson, I R. Cross, J S. Delaney, K Ferguson, C A. Francis, E D. Grew, C V. Guidotti, R L. Hervig, J M. Hughes, J Husler, W Leeman, A V. McGuire, D Rhede, H Roth, Rick L. Paul, I Richards, J Yates, M Yates

Reinvestigation of the Microwave Spectrum of Acetamide

August 1, 2001
Author(s)
R D. Suenram, G Y. Golubiatnikow, I Leonov, Jon T. Hougen, J Ortigoso, I Kleiner, Gerald T. Fraser
A total of 57 jet-cooled Fourier transform and 30 submillimeter measurements for acetamide have been recorded using a new version of our spectrometer which has been upgraded with a heated nozzle and an expanded automatic scanning range. The 115 transitions

Report of the Ultraviolet (UV) Subpanel

August 1, 2001
Author(s)
Joannie W. Chin
This manuscript is one of 7 sections in a report on the environmental durability of fiber-reinforced composite materials to be published and distributed by the Civil Engineering Research Foundation.

Research Into Non-Mercury Containing Metallic Alternatives

August 1, 2001
Author(s)
F Eichmiller
Many attempts have been made over the years with varying degrees of success to develop metallic alternatives to dental amalgam. Much of the difficulty in achieving success is the inability to meet the physical, mechanical and clinical criteria for an ideal

SEM Sentinel-SEM Performance Measurement System

August 1, 2001
Author(s)
Bradley N. Damazo, Andras Vladar, Alice V. Ling, Alkan Donmez, Michael T. Postek, Crossley E. Jayewardene
This paper describes the design and implementation of a system for monitoring the performance of a critical dimension measurement scanning electron microscope (CD-SEM). Experiments were performed for tests involving diagnosis of the vacuum system and

Silicon Nitride for Gas Turbines

August 1, 2001
Author(s)
Sheldon M. Wiederhorn, M Ferber
Silicon nitride is a material with a high-temperature potential and, hence, an excellent candidate for gas turbines. The incentive to use silicon nitride is substantial, as higher operating temperatures can be translated directly into higher engine

Silicon Single Atom Steps as AFM Height Standards

August 1, 2001
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Joseph Fu, V W. Tsai, E. C. Williams, Theodore V. Vorburger, H Edwards, D Cook, P West, R Nyffenegger
Atomic force microscopes (AFMs) are used in the semiconductor industry for a variety of metrology purposes. Step height measurements at the nanometer level and roughness measurements at sub-nanometer levels are often of interest. To perform accurate

Single Molecule Probes

August 1, 2001
Author(s)
Lori S. Goldner, K D. Weston, W F. Heinz, Jeeseong Hwang, E S. DeJong, John P. Marino
The technology to rapidly manipulate and screen individual molecules lies at the frontier of measurement science and impacts emerging bio- and nano-technologies. Fundamental biological and chemical processes can now be probed with unprecedented detail, one

Small Angle Neutron Scattering Study on Polymer-Clay Solutions

August 1, 2001
Author(s)
Charles C. Han, G Schmidt, A Nakatani, Paul D. Butler
The objective of this work is to investigate the influence of shear on the structure of a highly viscoelastic, aqueous polymer-clay solution. Many structural models have been proposed for such systems. However, this is the first time to observe the

SRM 482 Revisited After 30 Years

August 1, 2001
Author(s)
Eric S. Windsor, R Carlton, Scott A. Wight, C Lyman
The National Institute of Standards and Technology's (NIST) Standard Reference Material (SRM) 482 was issued by The National Bureau of Standards (NBS) in 1969 and has been continuously available to the public for over 30 years [1]. The standard consists of

Structural Effects in the Growth of Giant Magneto Resistance (GMR) Spin Valves

August 1, 2001
Author(s)
M. Menyhard, G. Zsolt, P. J. Chen, Cedric J. Powell, Robert D. McMichael, William F. Egelhoff Jr.
An investigation has been made of the thin-film structure and interface morphology of giant magnetoresistance (GMR) spin valves of the cobalt/copper/cobalt (Co/Cu/Co) type that were grown on polycrystalline NiO substrates at three different temperatures

Structural Effects in the Growth of Giant Magnetoresistance (GMR) Spin Valves

August 1, 2001
Author(s)
M. Menyhard, G. Zsolt, P J. Chen, Cedric J. Powell, Robert McMichael, William F. Egelhoff Jr.
Giant magnetoresistance (GMR) spin valves of the Co/Cu/Co type were grown on polycrystalline NiO substrates at three different temperatures. The GMR values and growth temperatures were: 14% for 150 K growth, 10% for 300 K growth, and 0% for 450 K growth

Structure and Dynamics of a Simulated Nano-Filled Polymer Melt

August 1, 2001
Author(s)
Francis W. Starr, T B. Schroeder, S C. Glotzer
To aid in the understanding and development o nano-filled polymer materials, we perform molecular dynamics simulations of an idealized filled polymer melt to probe the effects of a nanoscopic filler particle on the local melt structure and dynamics. We
Displaying 45301 - 45325 of 73960
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