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Search Publications

NIST Authors in Bold

Displaying 45201 - 45225 of 73697

The Claisen Rearrangement of an Unusual Substrate in Chorismate Mutase

July 1, 2001
Author(s)
S. E. Worthington, Morris Krauss
The calculated reaction path for an unusual substrate of chorismate mutase (Bacillus.subtilis) is found to be completely comparable to that of the native chorismate. In the unusual substrate, the cyclohexadienyl ring in chorismate is replaced by

The Expanding Role of Simulation in Future Manufacturing

July 1, 2001
Author(s)
Charles R. McLean, Swee K. Leong
Simulation technology holds tremendous promise for reducing costs, improving quality, and shortening the timeto- market for manufactured goods. Unfortunately, this technology still remains largely underutilized by industry today. This paper suggests

The Infrared Spectra of OCS + and OCS - Trapped in Solid Neon

July 1, 2001
Author(s)
C Lugez, Warren E. Thompson, Marilyn E. Jacox
When a Ne:OCS sample was codeposited at approximately 5 K with a beam of neon atoms that were excited in a microwave discharge, the infrared spectrum of the resulting deposit included absorptions which can be assigned to OCS +, OCS -, and one or more dimer

The International System of Units (SI), 2001 Edition

July 1, 2001
Author(s)
Barry N. Taylor
NIST Special Publication (SP) 330 is the United States version of the English text of the definitive international reference on the International System of Units (SI) published by the International Bureau of Weights and Measures (BIPM) on behalf of the

The Significance of Percolation on the Dynamics of Polymer Chains Bound to Carbon Black

July 1, 2001
Author(s)
A Nakatani, R Ivkov, P Papanek, C L. Jackson, H Yang, L T. Nikiel, M Gerspacher
Neutron time-of-flight (TOF) spectroscopy is used to compare the chain dynamics of pure polyisoprene with polyisoprene bound to the surface of various grades of carbon black fillers. The carbon black is compounded into the polyisoprene at various initial

Ultimate Capacities of Low-Rise Steel Frames in Turbulent Wind

July 1, 2001
Author(s)
S Jang, L L. Lu, Fahim H. Sadek, Emil Simiu
This paper is a derivative of G2001-1392, Database-Assisted Wind Load Capacity Estimates for Low-Rise Steel Frames, by Jang, S., et al., intended for publication in the Journal of Structural Engineering.The original paper's abstract was:A comparative study

Ultrastable Laser Array at 633 nm for Real-Time Dimensional Metrology

July 1, 2001
Author(s)
John R. Lawall, J Pedulla, Y LeCoq
We describe a laser system for very high-accuracy dimensional metrology. A sealed-cavity helium-neon laser is offset-locked to an iodine-stabilized laser in order to realize a secondary standard with higher power and less phase noise. Synchronous averaging

What to Expect When You Can Not Start at the Beginning

July 1, 2001
Author(s)
David E. Cypher
This presentation contains background information on the decision to create an Specification and Description Language (SDL) model, a discussion of the development cycle for the product development, a description of the SDL's creation, an explanation on how

X-Ray Scattering and Imaging From Plastically Deformed Metals

July 1, 2001
Author(s)
Gabrielle G. Long, Lyle E. Levine, Richard J. Fields
New ultra-small-angle X-ray scattering (USAXS) facilities at 3rd generation synchrotron sources enjoy an additional 1 to 3 decades of X-ray brilliance over 2nd generation instruments, and can now quantify microstructural features from 3nm to 1.3 m in size

Compensation for Stray Light in Projection Display Metrology

June 30, 2001
Author(s)
Paul A. Boynton, Edward F. Kelley
Electronic projection display specifications are often based on measurements made in ideal darkroom conditions and assume ideal measurement instrumentation. However, not everyone has access to such a facility, and not always will the light-measuring

Critical Dimension Metrology in the Scanning Electron Microscope

June 29, 2001
Author(s)
Michael T. Postek, Andras Vladar
Metrology is a principal enabler for the development and manufacture of current and future generations of semiconductor devices. With the potential of 130, 100 nanometer and even smaller linewidths and high aspect ratio structures, the scanning electron

A Reference Tristimulus Colorimeter

June 25, 2001
Author(s)
George P. Eppeldauer
The accuracy of tristimulus colorimeters can be increased by using detector standards instead of traditional lamp standards for calibration. After high accuracy absolute spectral response determination of the color channels, spectral and amplitude

Security - Revenue Generator and Mission Enabler

June 21, 2001
Author(s)
G Stoneburner
We need to facilitate a change in user perception of security from a hindrance to an essential revenue generator and mission enabler. The Common Criteria protection profile (PP) and security target (ST) constructs can be used to help achieve this need. Yet

Workshop on Fire Testing Measurement Needs: Proceedings

June 19, 2001
Author(s)
William L. Grosshandler
This report describes the proceedings of a workshop held on June 18 and 19, 2001, at NIST in Gaithersburg to identify where science and technology can better prepare fire testing laboratories and their customers to meet these challenges. Topics that were

Interpretation of Resonant Photoemission Spectra of Solid Actinide Systems

June 15, 2001
Author(s)
S Molodtsov, S Halilov, M Richter, A Zangwill, C Laubschat
It is shown that angle-resolved valence-band photoemission (PE) spectra of epitaxial close-packed films of U metal may correctly be described within a one-step model of PE based on a band description of the U 5f states. It is found that a cross-section
Displaying 45201 - 45225 of 73697
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