NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 45051 - 45075 of 73697

Reference Material 8091: New Scanning Electron Microscope Sharpness Standard

August 1, 2001
Author(s)
Andras Vladar, Michael T. Postek, Nien F. Zhang, Robert D. Larrabee, Samuel N. Jones, Russell E. Hajdaj
Reference Material (RM 8091) is intended primarily for use in checking the sharpness performance of scanning electron microscopes. It is supplied as a small, approximately 2 mm x 2 mm diced semiconductor chip. This sample is capable of being mounted

Reference Material 8091: New Scanning Electron Microscope Sharpness Standard

August 1, 2001
Author(s)
Andras Vladar, Michael T. Postek, Nien F. Zhang, Robert D. Larrabee, Samuel N. Jones, Russell E. Hajdaj
All scanning electron microscope-based inspection instruments, whether they are in a laboratory or on the production line, slowly lose their performance and then the instrument is no longer capable of providing as good quality, sharp images as before. This

Reference Minerals for Microanlaysis of Light Elements

August 1, 2001
Author(s)
M D. Dyar, M Wiedenbeck, D Robertson, I R. Cross, J S. Delaney, K Ferguson, C A. Francis, E D. Grew, C V. Guidotti, R L. Hervig, J M. Hughes, J Husler, W Leeman, A V. McGuire, D Rhede, H Roth, Rick L. Paul, I Richards, J Yates, M Yates

Reinvestigation of the Microwave Spectrum of Acetamide

August 1, 2001
Author(s)
R D. Suenram, G Y. Golubiatnikow, I Leonov, Jon T. Hougen, J Ortigoso, I Kleiner, Gerald T. Fraser
A total of 57 jet-cooled Fourier transform and 30 submillimeter measurements for acetamide have been recorded using a new version of our spectrometer which has been upgraded with a heated nozzle and an expanded automatic scanning range. The 115 transitions

Report of the Ultraviolet (UV) Subpanel

August 1, 2001
Author(s)
Joannie W. Chin
This manuscript is one of 7 sections in a report on the environmental durability of fiber-reinforced composite materials to be published and distributed by the Civil Engineering Research Foundation.

Research Into Non-Mercury Containing Metallic Alternatives

August 1, 2001
Author(s)
F Eichmiller
Many attempts have been made over the years with varying degrees of success to develop metallic alternatives to dental amalgam. Much of the difficulty in achieving success is the inability to meet the physical, mechanical and clinical criteria for an ideal

SEM Sentinel-SEM Performance Measurement System

August 1, 2001
Author(s)
Bradley N. Damazo, Andras Vladar, Alice V. Ling, Alkan Donmez, Michael T. Postek, Crossley E. Jayewardene
This paper describes the design and implementation of a system for monitoring the performance of a critical dimension measurement scanning electron microscope (CD-SEM). Experiments were performed for tests involving diagnosis of the vacuum system and

Silicon Nitride for Gas Turbines

August 1, 2001
Author(s)
Sheldon M. Wiederhorn, M Ferber
Silicon nitride is a material with a high-temperature potential and, hence, an excellent candidate for gas turbines. The incentive to use silicon nitride is substantial, as higher operating temperatures can be translated directly into higher engine

Silicon Single Atom Steps as AFM Height Standards

August 1, 2001
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Joseph Fu, V W. Tsai, E. C. Williams, Theodore V. Vorburger, H Edwards, D Cook, P West, R Nyffenegger
Atomic force microscopes (AFMs) are used in the semiconductor industry for a variety of metrology purposes. Step height measurements at the nanometer level and roughness measurements at sub-nanometer levels are often of interest. To perform accurate

Single Molecule Probes

August 1, 2001
Author(s)
Lori S. Goldner, K D. Weston, W F. Heinz, Jeeseong Hwang, E S. DeJong, John P. Marino
The technology to rapidly manipulate and screen individual molecules lies at the frontier of measurement science and impacts emerging bio- and nano-technologies. Fundamental biological and chemical processes can now be probed with unprecedented detail, one

Small Angle Neutron Scattering Study on Polymer-Clay Solutions

August 1, 2001
Author(s)
Charles C. Han, G Schmidt, A Nakatani, Paul D. Butler
The objective of this work is to investigate the influence of shear on the structure of a highly viscoelastic, aqueous polymer-clay solution. Many structural models have been proposed for such systems. However, this is the first time to observe the

SRM 482 Revisited After 30 Years

August 1, 2001
Author(s)
Eric S. Windsor, R Carlton, Scott A. Wight, C Lyman
The National Institute of Standards and Technology's (NIST) Standard Reference Material (SRM) 482 was issued by The National Bureau of Standards (NBS) in 1969 and has been continuously available to the public for over 30 years [1]. The standard consists of

Structural Effects in the Growth of Giant Magneto Resistance (GMR) Spin Valves

August 1, 2001
Author(s)
M. Menyhard, G. Zsolt, P. J. Chen, Cedric J. Powell, Robert D. McMichael, William F. Egelhoff Jr.
An investigation has been made of the thin-film structure and interface morphology of giant magnetoresistance (GMR) spin valves of the cobalt/copper/cobalt (Co/Cu/Co) type that were grown on polycrystalline NiO substrates at three different temperatures

Structural Effects in the Growth of Giant Magnetoresistance (GMR) Spin Valves

August 1, 2001
Author(s)
M. Menyhard, G. Zsolt, P J. Chen, Cedric J. Powell, Robert McMichael, William F. Egelhoff Jr.
Giant magnetoresistance (GMR) spin valves of the Co/Cu/Co type were grown on polycrystalline NiO substrates at three different temperatures. The GMR values and growth temperatures were: 14% for 150 K growth, 10% for 300 K growth, and 0% for 450 K growth

Structure and Dynamics of a Simulated Nano-Filled Polymer Melt

August 1, 2001
Author(s)
Francis W. Starr, T B. Schroeder, S C. Glotzer
To aid in the understanding and development o nano-filled polymer materials, we perform molecular dynamics simulations of an idealized filled polymer melt to probe the effects of a nanoscopic filler particle on the local melt structure and dynamics. We

Studies of polymer-filler interactions in filled systems

August 1, 2001
Author(s)
Alamgir Karim, Jack F. Douglas, K A. Barnes, A Nakatani, D W. Liu, Eric J. Amis
We observe that the presence of filler partiocles can have a major impact on the properties of filled polymer blend materials. The filler particles, which are found in many commercial polymer blends, modify the phase boundary (interfacial tension, rate of

Surface and Interface Effects in the Growth of Giant Magnetoresistance Spin Valves for Ultrahigh-Density Data-Storage Applications

August 1, 2001
Author(s)
William F. Egelhoff Jr., P J. Chen, Cedric J. Powell, Robert D. McMichael, Mark D. Stiles
The current generation of hard disk drives use Giant Magnetoresistance (GMR) spin valves as the read-head because the GMR effect is currently the most sensitive way to detect magnetic fields at submicron length scales and data rates of {approximately equal

Temporal Character of Pulsed-Laser Cone Emission

August 1, 2001
Author(s)
W Gawlik, R Shuker, Alan Gallagher
Temporal character of cone emission from Sr vapor excited with 3 ns, near-resonant laser pulses is studied with 0.5 ns resolution. The cone pulses appear significantly narrower than the laser pulse. Their properties (amplitude, width, energy, delay and

The Art and Science of Lamp Photometry

August 1, 2001
Author(s)
R S. Bergman, Yoshi Ohno
This paper first overviews photometric quantities of lamps - luminous flux, luminous intensity, illuminance, and luminance - and general techniques for measurement of these quantities to characterize lamps. The total luminous flux of lamps (in lumens) is
Displaying 45051 - 45075 of 73697
Was this page helpful?