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Electron Diffraction Using Transmission Electron Microscopy

Published

Author(s)

Leonid A. Bendersky, Frank W. Gayle

Abstract

Electron diffraction via the transmission electron microscope is a powerful method for characterizing the structure of materials, including perfect crystals and defect structures. The advantages of electron diffraction over other methods, e.g., x-ray or neutron, arise from the extremely short wavelength (~2 pm), the strong atomic scattering, even from light elements, and the ability to examine tiny volumes of matter (~ 10 nm(Superscript 3)). The NIST Materials Science and Engineering Laboratory has a history of discovery and characterization of new structures through electron diffraction, alone or in combination with other diffraction methods. This paper provides a survey of some of this work enabled through electron microscopy.
Citation
Journal of Research (NIST JRES) -
Volume
106 No. 6

Keywords

crystal structure, crystallography, defects, electron diffraction, phase transitions, quasicrystals, transmission electron microscopy

Citation

Bendersky, L. and Gayle, F. (2001), Electron Diffraction Using Transmission Electron Microscopy, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed April 20, 2024)
Created November 1, 2001, Updated February 17, 2017