TY  - GEN
AU  - Leonid Bendersky
AU  - Frank Gayle
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2001-11-01
LA  - en
M1  - 106 No. 6
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2001
TI  - Electron Diffraction Using Transmission Electron Microscopy
ER  -