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NIST Authors in Bold

Displaying 41901 - 41925 of 74171

SCUBA-2: a large format submillimeter camera on the James Clerk Maxwell Telescope

January 20, 2003
Author(s)
Wayne Holland, William Duncan, Kent D. Irwin, Anthony Walton, Peter Ade, Ian Robson
SCUBA-2 is a second generation, wide-field submillimeter camera under development for the James Clerk Maxwell Telescope. With over 12,000 pixels, in two arrays, SCUBA-2 will map the submillimeter sky 1000 times faster than the current SCUBA instrument to

Mechanical Behavior of Caulks and Sealants

January 15, 2003
Author(s)
Donald L. Hunston, Christopher C. White
ulks and Sealants are important examples of consumer products where performance depends critically on rheological properties. This work describes the development of a testing and modeling procedure to characterize the basic mechanical properties of such

Time-Division SQUID Multiplexers for Transition-Edge Sensors

January 14, 2003
Author(s)
Kent D. Irwin, James A. Beall, Joern Beyer, Steven Deiker, W.Bertrand (Randy) Doriese, S. L. Ferreira, Gene C. Hilton, Sae Woo Nam, Carl D. Reintsema, Joel Ullom, Leila R. Vale
Microcalorimeters and bolometers based on superconducting transition-edge sensors (TES) are important tools for the detection of photons from millimeter waves through gamma rays, and for applications ranging from materials analysis to astronomy. There is a

Electron Energy Loss Spectroscopy of CeO 2 -x Nanoparticles

January 7, 2003
Author(s)
W Lijun, H J. Wiesmann, A R. Moodenbaugh, Daniel A. Fischer, Y Zhu, M Suenaga
ria has been widely studied due to its applications, such as a catalyst in vehicle emissions system and an electrolyte material in solid oxide fuel cells. Recently, it has been reported that CeO2-x nanoparticles exhibit lattice expansion and valence

A Mechanism for Brightening: Linear Stability Analysis of the Curvature Enhanced Coverage Model

January 6, 2003
Author(s)
Geoffrey B. McFadden, Sam R. Coriell, Thomas P. Moffat, Daniel Josell, Daniel Wheeler, W Schwarzacher
This work presents experiments and theory describing a mechanism for how brighteners in electrolytes function. The mechanism involves change of local coverage of a deposition rate enhancing catalyst adsorbed on the surface through change of local surface

Testing with Model Checker: Insuring Fault Visibility

January 5, 2003
Author(s)
Vadim Okun, Paul E. Black, Yelena Yesha
To detect a fault in software, a test case execution must be chosen so intermediate errors propagate to the output. We describe two modeling methods for specification-based mutation testing using model checkers that guarantee this propagation. We evaluate

Single-Cooper-Pair Transistors: Requirements for Robust 2e Periodicity

January 3, 2003
Author(s)
Joe Aumentado, Mark W. Keller, John M. Martinis
The superconducting analog of the single-electron transistor (SET), the single-Cooper-pair transistor (SCPT), is comprised of two ultrasmall tunnel junctions in series forming an island (see Figure 1(a)). Transport through the SCPT depends on the

2 2 S 1/2 Transition of Atomic Lithium by Doppler-Free Two-Photon Spectroscopy

January 1, 2003
Author(s)
W DeGraffenreid, Craig J. Sansonetti
We have investigated the 2 2S1/2 - 4 2S1/2 two-photon transition in atomic lithium by high resolution laser spectroscopy. The frequencies of the two-photon resonances have been measured with an accuracy of better than 1 MHz using our Fabry-Perot wavemeter

A 193 nm Detector Nonlinearity Measurement System at NIST

January 1, 2003
Author(s)
Shao Yang, Darryl A. Keenan, Holger Laabs, Marla L. Dowell
To meet the semiconductor industry's demands for accurate measurements on excimer lasers, we have developed a system using the correlation method to measure the nonlinear response of pulse energy detectors of excimer laser at 193 nm. The response of the

A 193 nm Laser Detector Nonlinearity Measurement System

January 1, 2003
Author(s)
Darryl A. Keenan, Holger Laabs, Shao Yang, Marla L. Dowell
To meet the semiconductor industry's demands for accurate measurements, we have developed a method to characterize the nonlinear response of 193 nm excimer laser detectors. This system is complimentary to our other excimer laser power and energy
Displaying 41901 - 41925 of 74171
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