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PUBLICATIONS

Statistical Uncertainty Analysis of Key Comparison CCEM-K2

Published

Author(s)

Nien F. Zhang, N Sedransk, Dean G. Jarrett

Abstract

The details of a statistical uncertainty analysis applied to key comparison CCEM-K2 are reported. The analysis presented here provides an approach for addressing known correlations which have been of concern in reporting key comparison results. Uncertainties for each participating national metrology institute (NMI), the key comparison reference value (KCRV), and the pairs of NMIs are determined by fully considering the covariances that interrelate the measurement of the time-dependant transport standards. Uncertainties of the pilot laboratory are treated differently than those of other NMIs due to the predicted values of the transport standards for all NMIs being based on pilot laboratory data. The approach separates the Type A and Type B uncertainty components providing the benefit that data from multiple artifacts (three in this instance) reduces the computed Type A uncertainties.
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
52
Issue
No. 2
Pub Type
Journals

Keywords

analysis, artifact, key comparison, linear regression, measurement, pilor laboratory, resistor, statistical transport standard, uncertainty

Citation

Zhang, N. , Sedransk, N. and Jarrett, D. (2003), Statistical Uncertainty Analysis of Key Comparison CCEM-K2, IEEE Transactions on Instrumentation and Measurement (Accessed December 12, 2024)

Issues

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Created April 1, 2003, Updated February 17, 2017