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Displaying 41926 - 41950 of 73963

Effects of noise level in fitting in situ optical reflectance spectroscopy data

January 1, 2003

Author(s)

Chih-chiang Fu, Kristine A. Bertness, C. M. Wang

Curve-fitting of simulated optical reflectance spctroscopy data is used to evaluate the accuracy of parameters derived from the fits of actual data. These simulations show that to determine the index of refraction 'n' to an accuracy of 0.0015

Effects of Ultraviolet Radiation Exposure on Vinyl Ester Resins: Characterization of Chemical, Physical and Mechanical Damage

January 1, 2003

Author(s)

A Signor, Mark R. VanLandingham, Joannie W. Chin

The increased use of fiber-reinforced vinyl ester composites in outdoor applications has led to questions concerning the environmental durability of these materials, particularly as related to UV exposure. In this work, artificial ultra-violet (UV)

Effects of Ultraviolet Radiation Exposure on Vinyl Ester Resins: Characterization of Chemical, Physical, and Mechanical Damage

January 1, 2003

Author(s)

A Signor, Joannie W. Chin, Mark R. VanLandingham

Electromagnetic Technology Division 2002 Technical Accomplishments

January 1, 2003

Author(s)

Sara E. Metz

The roughly forty staff and guest scientists in the Electromagnetic Technology Division take great pride in bringing you this brief report on recent progress in our Division. We have a long history of inventing and disseminating new standards and

Electron Self-energy Calculation using a General Multi-pole Approximation

January 1, 2003

Author(s)

J J. Rehr, J A. Soininen, Eric L. Shirley

Electron Self-Energy Calculation Using a General Multi-Pole Approximation

January 1, 2003

Author(s)

J A. Soininen, J J. Rehr, Eric L. Shirley

Electron-Impact Broadening of the 3s-3p{/I] Lines in Low-Z Li-like Ions

January 1, 2003

Author(s)

Yuri Ralchenko, H R. Griem, I Bray

Electron-Impact Ionization Cross Section Database (version 2.0)

January 1, 2003

Author(s)

Y K. Kim, K K. Irikura, M E. Rudd, D S. Zucker, M A. Zucker, J S. Coursey, Karen J. Olsen, G G. Wiersma

Electron-Impact Total Ionization Cross Sections of the Chlorofluoromethanes

January 1, 2003

Author(s)

K K. Irikura, M A. Ali, Y -. Kim

Electron-Impact Total Ionization Cross-Sections of the Chlorofluoromethanes

January 1, 2003

Author(s)

Karl K. Irikura, M A. Ali, Yong Sik Kim

Electron-impact total ionization cross sections for CCl 3F (Freon 11), CCl 2F 2 (Freon 12), CClF 3 (Freon 13), CHCl 2F (Freon 21), CHClF 2 (Freon 22), and CH 2ClF (Freon 31) are calculated using the Binary-Encounter-Bethe (BEB) theoretical model. The BEB

Electronic and Magnetic Properties of Heterofullerene C 48 B 12

January 1, 2003

Author(s)

Rui-Hua Xie, L Jensen, Garnett W. Bryant, J Zhao, J Smith, H V, Structural

Electronic Properties of Quantum-dot Molecules

January 1, 2003

Author(s)

W Jaskolski, M Zielinski, Garnett W. Bryant

Electronic, Vibrational and Magnetic Properties of a Novel C 48 N 12 Aza-Fullerene

January 1, 2003

Author(s)

R H. Xie, Garnett W. Bryant, V H. Smith

The structural, electronic, vibrational and magnetic properties of a novel C 48N 12 aza-fullerene are studied by using density functional and Hartree-Fock methods. Optimized geometries and total energy of this aza-fullerene are calculated. The HOMO-LUMO

Electronic, Vibrational and Magnetic Properties of a Novel C 48 N 12 Aza-fullerene

January 1, 2003

Author(s)

Rui-Hua Xie, Garnett W. Bryant, J Smith, H V

Electronics and Electrical Engineering Laboratory Magnetic Technology Division Programs, Activities, and Accomplishments

January 1, 2003

Author(s)

C L. Clark

One of NIST's seven measurement and standards laboratories, EEEL conducts research, provides measurement services, and helps set standards in support of the fundamental electronic technologies of semiconductors, magnetics, and superconductors; information

Electrospray Ionization Mass-Spectrometry of Ionic Liquids and Determination of Their Solubility in Water

January 1, 2003

Author(s)

Z B. Alfassi, Robert E. Huie, B L. Milman, Pedatsur Neta

Electrospray ionization-mass spectrometry is used to detect both the cations (C +) and the anions (A') of ionic liquids (CA) in aqueous methanol solutions. In addition to the main peaks of the parent ions, fragmentation products are observed upon