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Displaying 41826 - 41850 of 73697

MatML Version 3.0 - Schema

January 1, 2003
Author(s)
E F. Begley
This document contains the formal specification of MatML Version 3.0 - Schema in World Wide Web Schema Definintion Language and is an update of the previously released Annotated MatML DTD Working Draft Version 2.0. This update addresses the technical

Measurement and Control Based on a Common Sense of Time using IEEE 1588

January 1, 2003
Author(s)
Kang B. Lee
Distributed measurement and control systems in which all components share a common sense of time allow significant decoupling of synchronization issues from considerations of communication latency and fluctuation. This decoupling enables new techniques for

Measurement of The Solar Neutrino Capture Rate In SAGE

January 1, 2003
Author(s)
V N. Gavrin, J N. Abdurashitov, T J. Bowles, B T. Cleveland, S R. Elliott, S V. Girin, V V. Gorbachev, P P. Gurkina, T V. Ibragimova, A V. Kalikhov, N G. Khairnasov, T V. Knodel, I N. Mirmov, Jeffrey S. Nico, W A. Teasdale, E P. Veretenkin, V M. Vermul, J F. Wilkerson, V E. Yants, G T. Zatsepin

Measurements of the Refractive Indices of MOCVD and HVPE Grown AlGAN Films Using Prism-Coupling Techniques Correlated With Spectroscopic Reflection/Transmission Analysis

January 1, 2003
Author(s)
Norman Sanford, Larry Robins, Albert Davydov, Alexander J. Shapiro, Denis V. Tsvetkov, Vladimir A. Dmitriev, Stacia Keller, Umesh Mishra, Steven P. DenBaars
Waveguide prism-coupling methods were used to measure the ordinary and extraordinary refractive indices of Al xGaN films grown on sapphire substrates by HVPE and MOCVD. Several discrete wavelengths ranging from 442 nm to 1064 nm were used and the results

Measuring the Mechanical Properties of a Thin Polymeric Film by AFM

January 1, 2003
Author(s)
P M. McGuiggan, D J. Yarusso
The atomic force microscope is used to measure the tan delta (loss modulus/storate modulus) of a thin film of poly(n-butylacrylate) as a function of frequency. The AFM results are in good agreement with indenter measurements. The results demonstrate that

Mechanical Behavior of Contact Aluminum Alloy

January 1, 2003
Author(s)
David T. Read, Yi-Wen Cheng, Joseph D. McColskey, R R. Keller
Here we report the results of tensile tests of thin films of Al-0.5 % Cu deposited on bare silicon. This material was on a wafer that was subjected to the complete CMOS fabrication process, tensile strength, and elongation were all lower than the

Mechanical Testing for Ceramics

January 1, 2003
Author(s)
George D. Quinn
This article describes (briefly) the common tests used for strength testing of ceramics.

Micromechanical Instruments for Ferromagnetic Measurements

January 1, 2003
Author(s)
John M. Moreland
I review some of the novel methods for measuring ferromagnetic properties of thin films based on micromechanical magnetometers. Measurements rely on the detection of mechanical forces or torques on samples deposited onto microcantilevers. Displacements of

Mode-Locked and Single-Frequency Er/Yb Co-Doped Waveguide Lasers

January 1, 2003
Author(s)
John B. Schlager, Berton Callicoatt, Richard Mirin, Norman Sanford
Erbium/ytterbium co-doped planar waveguide lasers are fabricated for low-jitter mode-locked operation and single-frequency operation at 1.54 υm. The passively mode-locked lasers produce picosecond pulses at fundamental repetition rates up to 1 GHz with
Displaying 41826 - 41850 of 73697
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