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Displaying 41476 - 41500 of 73697

A Two-Phase Airframe Shielding Performance Study Using Ultra-wideband Measurement Systems

January 1, 2003
Author(s)
Chriss A. Grosvenor, Robert T. Johnk, David R. Novotny, Seturnino Canales, Claude Weil, Jason Veneman
The National Institute of Standards and Technology participated in a comprehensive study of electromagnetic aircraft shielding. The effort consisted of two parts: (1) shielding measurements on a box model with a simple and precisely controlled geometry

Accuracy of AlGaAs Growth Rates and Composition Determination Using RHEED Oscillations

January 1, 2003
Author(s)
Todd E. Harvey, Kristine A. Bertness, Robert K. Hickernell, C. M. Wang, Jolene Splett
We investigate the sources of uncertainty in the measurement of the reflection high-energy electron diffraction (RHEED) intensity oscillations during growth of AlAs, GaAs, and AlGaAs on GaAs substrates, and the resulting effects on predicted growth rates

Advanced Test and Calibration Systems for Integrated Multi-Sensor Platforms with IR, Visible, and Laser Range Finder/Designator Capabilities

January 1, 2003
Author(s)
Paul Bryant, Jack Grigor, Pat Harris, Brian Rich, Alan Irwin, Steve McHugh, Daniel W. King, Rodney Leonhardt
This paper discusses recent advances in the development of test and evaluation instrumentation for military laser range finder (LRF) and designation systems. Recent strides have been made in the development of sophisticated active ranging simulation

An Alternative Method of Solving Multilayer Bending Problem

January 1, 2003
Author(s)
C H. Hsueh, S K. Lee, Tze J. Chuang
Stress distributions in multilayers subjected to both residual stresses and external bending are analyzed to derive closed-form analytical solutions. There are always three unknowns to be solved and three equilibrium conditions to be satisfied in the

Analytical Advances in the SEM

January 1, 2003
Author(s)
J H. Scott
The scanning electron microscope (SEM) - when equipped with one or more x-ray spectrometers - is undoubtedly one of the most powerful tools ever devised for the chemical analysis of solid samples at micrometer and submicrometer length scales. As a finely
Displaying 41476 - 41500 of 73697
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