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Displaying 41476 - 41500 of 73970

Biometric Standards -- A Key to a More Secure World

March 1, 2003
Author(s)
Michael D. Hogan, Fernando L. Podio
Biometric technologies are becoming the foundation of an array of highly secure identification and verification solutions. Over the past eighteen months, the U.S has quickly worked to establish formal standards groups for accelerating and harmonizing the

Change Detection In XML Documents

March 1, 2003
Author(s)
K H. Lee, Y C. Choy, S B. Cho, Xiao Tang, V R. McCrary
This paper presents an efficient algorithm to detect changes between old and new versions of an XML document. The difference between the two versions can be considered to be an edit script that transforms one document tree into another. The proposed

Chemically Amplified Resist Fundamentals Studies by Combinatorial approaches

March 1, 2003
Author(s)
M Wang, Vivek Prabhu, Eric K. Lin, Michael J. Fasolka, Alamgir Karim
Sub-100 nm lithography requires more understanding of photoresist material properties and processing conditions to achieve necessary critical dimension control of patterned structures. As resist thickness and feature linewidth decrease, fundamental

Complex Permittivity Measurements of Common Plastics over Variable Temperatures

March 1, 2003
Author(s)
Billy F. Riddle, James R. Baker-Jarvis, Jerzy Krupka
In this paper we present complex permittivity data at macorwave frequencies for many common plastics from 125 K to 375 K. The measurements were made using a TE 01δ dielectric resonator placed inside an environmental chamber. Data are presented for the

Cracking and the Indentation Size Effect for Knoop Hardness of Glasses

March 1, 2003
Author(s)
George D. Quinn, P Green, K Xu
The Knoop Hardness of five glasses as measured over a wide range of indentation loads. Hardness decreased with increasing load in accordance with the classic indentation size effect (ISE). At moderate loads, cracking dramatically altered the indentation

Creation of a Dipolar Superfluid in Optical Lattices

March 1, 2003
Author(s)
B Damski, L Santos, E Tiemann, M Lewenstein, Svetlana A. Kotochigova, Paul S. Julienne, W.H. Zoller
We show that by loading a Bose-Einstein condensate (BEC) of two different atomic species into an optical lattice, it is possible to achieve a Mott-insulator phase with exactly one atom of each species per lattice site. A subsequent photo-association leads

Critical Dimension and Overlay Metrology

March 1, 2003
Author(s)
Michael T. Postek, Marylyn H. Bennett
Critical dimension and overlay metrology are two of the important measurements made in semiconductor device fabrication. Critical dimension metrology is important to ensure that the product meets the design target and overlay metrology ensures correct

Decay and Revival of Phase Coherence of a Bose-Einstein Condensate in a One-Dimensional Lattice

March 1, 2003
Author(s)
O Morsch, J H. Muller, D Ciampini, M Cristiani, P B. Blakie, Carl J. Williams, Paul S. Julienne, E Arimondo
The mode structure of a Bose-Einstein condensate non-adiabatically loaded into a one-dimensional optical lattice is studied by analyzing the visibility of the interference pattern as well as the radial profile of the condensate after a time-of-flight. A

Dielectric Permittivity of Eight Gases Measured with Cross Capacitors

March 1, 2003
Author(s)
James W. Schmidt, Michael R. Moldover
A 4-ring, toroidal cross capacitor was used to measure accurately the relative dielectric permittivity ε(p,T) of He, Ar, N 2, O 2, CH 4, C 2H 6, C 3H 8, and CO 2. (ε is often called the dielectric constant. ) The data are in the range from 0 C to 50 C and

Effect of Caged Fluorescent Dye on the Electroosmotic Mobility in Microchannels

March 1, 2003
Author(s)
David J. Ross, Laurie E. Locascio
We report on measurements of electroosmotic mobility in polymer microchannels and silica capillaries with and without the addition of a caged fluorescein dye to the buffer. For PMMA microchannels, the mobility was found to increase from (2.6 0.1) 10-4 cm2

Electron Backscatter Diffraction for Studies of Localized Deformation

March 1, 2003
Author(s)
R.H. Geiss, Alexana Roshko, Kristine A. Bertness, T Keller
Electron backscatter diffraction (EBSD) was used to study localized deformation in two types of constrained-volume materials. We present a study of deformation in narrow aluminum interconnects after low frequency, AC cycling at high current density. Joule

Embedded Capacitance Materials and Their Application in High Speed Designs

March 1, 2003
Author(s)
T Bergstresser, R Hilburn, Jan Obrzut, K. M. Phillips
In this paper, we review three material options for embedded capacitors: thin FR4 epoxy-glass laminate, adhesiveless copper on polyimide substrate, and unsupported epoxy filled with high dielectric constant ceramic powder. Characteristics including

Estimation of Q-factors and Resonant Factors

March 1, 2003
Author(s)
Kevin Coakley, Jolene Splett, Michael D. Janezic, Raian K. Kaiser
We estimate the quality factor Q and resonant frequency f 0 of a microwave cavity based on resonance curve observations on an equally-spaced frequency grid. The observed resonance curve is the squared magnitude of an observed complex scattering parameter

Estimation of Q-Factors and Resonant Frequencies

March 1, 2003
Author(s)
Kevin J. Coakley, Jolene D. Splett, Michael D. Janezic, R F. Kaiser
We estimate the quality factor Q and resonant frequency f o of a microwave cavity based on resonance curve observations on an equally-spaced frequency grid. The observed resonance curve is the squared magnitude of an observed complex scattering parameter

Expected Multi-Hop Power Consumption in Mobile Ad-Hoc Networks

March 1, 2003
Author(s)
Camillo A. Gentile
Mobile Ad-Hoc Networks provide the means to reduce significantly the power required for routing from source to destination through multi-hops between other nodes in the network. In the presence of mobility, only continuous updating can guarantee routes
Displaying 41476 - 41500 of 73970
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