NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 41451 - 41475 of 73697

2 2 S 1/2 Transition of Atomic Lithium by Doppler-Free Two-Photon Spectroscopy

January 1, 2003
Author(s)
W DeGraffenreid, Craig J. Sansonetti
We have investigated the 2 2S1/2 - 4 2S1/2 two-photon transition in atomic lithium by high resolution laser spectroscopy. The frequencies of the two-photon resonances have been measured with an accuracy of better than 1 MHz using our Fabry-Perot wavemeter

A 193 nm Detector Nonlinearity Measurement System at NIST

January 1, 2003
Author(s)
Shao Yang, Darryl A. Keenan, Holger Laabs, Marla L. Dowell
To meet the semiconductor industry's demands for accurate measurements on excimer lasers, we have developed a system using the correlation method to measure the nonlinear response of pulse energy detectors of excimer laser at 193 nm. The response of the

A 193 nm Laser Detector Nonlinearity Measurement System

January 1, 2003
Author(s)
Darryl A. Keenan, Holger Laabs, Shao Yang, Marla L. Dowell
To meet the semiconductor industry's demands for accurate measurements, we have developed a method to characterize the nonlinear response of 193 nm excimer laser detectors. This system is complimentary to our other excimer laser power and energy

A Model for Step Height, Edge Slope and Linewidth Measurements Using AFM

January 1, 2003
Author(s)
Xuezeng Zhao, Theodore V. Vorburger, Joseph Fu, Jun-Feng Song, C Nguyen
Nano-scale linewidth measurements are performed in semiconductor manufacturing and in the data storage industry and will become increasingly important in micro-mechanical engineering. With the development of manufacturing technology in recent years, the

A Phenomenological Droplet Impact Model for Lagrangian Spray Transport

January 1, 2003
Author(s)
P E. DesJardin, Cary Presser, P J. Disimile, J R. Tucker
The overall objective of this research is to gain fundamental knowledge of fire-suppression agent transport in the cluttered environments of aircraft engine nacelles (i.e., hydraulic and electrical lines, mounting brackets, etc.). A new generation of Halon

A ratiometric method for Johnson noise thermometry using a quantized voltage noise source

January 1, 2003
Author(s)
Sae Woo Nam, Samuel Benz, John M. Martinis, Paul Dresselhaus, Weston L. Tew, David R. White
Johnson Noise Thermometry (JNT) involves the measurement of the statistical variance of a fluctuating voltage across a resistor in thermal equilibrium. Modern digital techniques make it now possible to perform many functions required for JNT in highly
Displaying 41451 - 41475 of 73697
Was this page helpful?