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Displaying 41301 - 41325 of 74404

Missing Data Methods and Toolbox Users Guide

July 2, 2003
Author(s)
Curtis H. Parks, Gerard N. Stenbakken, Alexei Nikolaev
Measurement data are collected to characterize a production run of devices that can then be analyzed to identify a reduced set of measurement points. Such measurement arrays can contain missing values. Missing data analysis methods are described, together

A Framework for Modeling and Simulation for Emergency Response

July 1, 2003
Author(s)
Sanjay Jain, Charles R. McLean
A number of modeling and simulation tools have been developed and more are being developed for emergency response applications. The available simulation tools are mostly meant for standalone use. Addressing an emergency incident requires addressing

A Hurricane Damage Prediction Model for Residential Structures

July 1, 2003
Author(s)
A Cope, K Gurley, James J. Filliben, Emil Simiu, J P. Pinelli, C Subramanian, L. Zhang, S Hamid
The focus of this paper is the development of a probabilistic model for the prediction of structural damage due to hurricane winds in the state of Florida. This is a necessary component to a model currently under development to predict annualized insurable

A Mathematical Model of Wire Feeding Mechanisms in GMAW

July 1, 2003
Author(s)
T M. Padilla, D. R. Munoz, Timothy P. Quinn, R. A. Rorrer
A Hertzian based contact model of the friction between the welding wire and the wire liner has been developed to predict the wire pulling force for gas metal arc welding (GMAW). The model predicts a 2.5:1exponential increase in wire pulling force as the

An Optimization Approach to Multiple Sequence Alignment

July 1, 2003
Author(s)
Fern Y. Hunt, Anthony J. Kearsley, H H Wan
The problem of multiple sequence alignment is recast as an optimization problem using Markov decision theory. One seeks to minimize the expected or average cost of alignment subject to data-derived constraints. In this setting the problem is equivalent to

Analysis of Effective Thermal Properties of Thermall Thick Materials

July 1, 2003
Author(s)
Frederick W. Mowrer
The standard methods used to derive effective thermal properties of thermally thick materials based on bench-scale radiant exposure tests are reviewed and analyzed. These methods are compared with numerical calculations for the same boundary conditions

Atomic Spectral Tables for the Chandra X-Ray Observatory, Part I (S VIIl - S XIV)

July 1, 2003
Author(s)
Larissa Podobedova, Arlene Musgrove, Daniel E. Kelleher, Joseph Reader, Wolfgang L. Wiese
Tables of critically compiled wavelengths, energy levels, line classifications, and transition probabilities are given for spectra of ionized sulfur (S VIII - S XIV) in the region 21 to 170 . These tables provide data of interest for the Emission Line

BACnet Wide Area Network Security Threat Assessment

July 1, 2003
Author(s)
David G. Holmberg
This technical report addresses inter-networked building automation and control systems (BAS or BCS) using the BACnet protocol [ANSI/ASHRAE, 2001]. The report deals with threats from known sources due to communication connections to the corporate LAN and

BACnet Wide Area Network Security Threat Assessment.

July 1, 2003
Author(s)
David G. Holmberg
This technical report addresses inter-networked building automation and control systems (BAS or BCS) using the BACnet protocol [ANSI/ASHRAE, 2001]. The report deals with threats from known sources due to communication connections to the corporate LAN and

Bench-Scale Flammability Measures for Electronic Equipment

July 1, 2003
Author(s)
Matthew F. Bundy, Thomas J. Ohlemiller
An experimental study of the bench-scale fire performance of 18 commercial polymeric materials was conducted by the National Institute of Standards and Technology. The performance of these materials was characterized using three standard flammability tests

Building a Filtering Tst Collection for TREC 2002

July 1, 2003
Author(s)
Ian Soboroff, S E. Robertson
Test collections for the filtering track in TREC have typically used either past sets of relevance judgments, or categorized collections such as Reuters Corpus Volume 1 or OHSUMED, because filtering systems need relevance judgments during the experiment

CD-SEM Measurement of Line Edge Roughness Test Patterns for 193 nm Lithography

July 1, 2003
Author(s)
B Bunday, M R. Bishop, John S. Villarrubia, Andras Vladar
The measurement of line-edge roughness (LER) has recently become a major topic of concern in the litho-metrology community and the semiconductor industry as a whole, as addressed in the 2001 International Technology Roadmap for Semiconductors (ITRS)

CD-SEM Measurement of Line-Edge Roughness Test Patterns for 193-nm Lithography

July 1, 2003
Author(s)
B Bunday, M R. Bishop, John S. Villarrubia, Andras Vladar
The measurement of line-edge roughness (LER) has recently become a major topic of concern in the litho-metrology community and the semiconductor industry as a whole, as addressed in the 2001 International Technology Roadmap for Semiconductors (ITRS)

Ceramics Lubrication

July 1, 2003
Author(s)
Stephen M. Hsu, Richard S. Gates, D E. Deckman
ramics are hard, brittle, and chemically inert under most environments. They wear by abrasion and fracture. Since brittle fracture is very sensitive to stress intensity factors, ceramic wear is dominated by stress intensity at various scales. Under mild

Characterization of Chinese Ink in Size and Surface

July 1, 2003
Author(s)
J R. Swider, Vincent A. Hackley, J Winter
Chinese lnk, a mixture of soot and animal glue, has been used in East Asia for centuries as the sole black paint of choice. The combination of animal glue and soot particles creates a distinctive dispersion system giving Chinese Ink its unique properties

Coherent imagin of nanoscale plasmon patterns with a carbon nanotue optical probe

July 1, 2003
Author(s)
R Hillenbrand, F Keilmann, P Hanarp, D S. Sutherland, J Aizpurua
We introduce a carbon nanotube as optical near-field probe and apply it to visualize the plasmon fields of metal nanostructures in both amplitude and phase at 30 nm resolution. With 91 nm Au disks designed for fundamental plasmon resonance, we observe the

Combinatorial Edge Delamination Test for Thin Film Adhesion Concept, Procedure, Results

July 1, 2003
Author(s)
Martin Y. Chiang, J He, R Song, Alamgir Karim, Wen-Li Wu, Eric J. Amis
A high-throughput combinatorial approach to edge delamination test is proposed to map the failure of adhesion as a function of both temperature and film thickness in a single step. In this approach, a single specimen of a thin film bonded to a substrate
Displaying 41301 - 41325 of 74404
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