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NIST Authors in Bold

Displaying 40351 - 40375 of 73960

Enemies at the Gates: Securing the BACnet building

November 1, 2003
Author(s)
David G. Holmberg
This article seeks to increase awareness of the threats associated with connecting the building control system (specifically a BACnet system) to a wider network. In addition, it presents countermeasures available for addressing security threats

Exploring and Extending the Limits of CD-SEMs' Resolution

November 1, 2003
Author(s)
Andras Vladar, Michael T. Postek, John S. Villarrubia
This study of SEM resolution is occasioned by concerns that it is no longer adequate for lithography process control in integrated circuit manufacturing. For example, according to the most recent International Technology Roadmap for Semiconductors, the in

Extinction Near-Field Optical Microscopy

November 1, 2003
Author(s)
H F. Hamann, M Larbadi, S Barzen, T Brown, Alan Gallagher, David Nesbitt
Two AFM-assisted, apertureless, optical-imaging methods are presented. These overcome the severe resolution consrtaints of aperture-based Near-field Scanning Optical Microscopy by probing the highly localized mutual near-field interaction between AFM-tip

Fundamental Electron Interactions with Plasma Processing Gases

November 1, 2003
Author(s)
Loucas G. Christophorou, James K. Olthoff
This volume deals with the basic knowledge and undestanding of fundamtal interactions of low energy electrons with molecules. It provides an up-to-date and comprehensive account of the fundamental interactions of low energy energy electrons with molecules

High Frequency Loss Mechanism in Polymers Filled With Dielectric Modifiers

November 1, 2003
Author(s)
Jan Obrzut, A Anopchenko, K Kano, Haonan Wang
We analyzed the high frequency dielectric relaxation mechanism in high-k composite materials using film substrates made of low loss organic resin filled with ferrolectric ceramics and with single wall carbon nanotubes (SWNT). The highest frequencey

High Throughput Methods for Polymer Nanocomposites Research: Extrusion, Nmr Characterization and Flammability Property Screening.

November 1, 2003
Author(s)
Jeffrey W. Gilman, S Bourbigot, John R. Shields, Marc R. Nyden, Takashi Kashiwagi, Rick D. Davis, David L. VanderHart, W Demory, C A. Wilkie, A B. Morgan, J R. Harris, R Lyon
Several, recent, revolutionary advances in combinatorial (or high throughput, HT) polymer science have appeared in the literature, which significantly accelerate the rate of data generation. Although these new HT approaches may in part have been inspired

Infrared Spectra of trans-HOCO, HCOOH + , and HCO 2 - Trapped in Solid Neon

November 1, 2003
Author(s)
D Forney, Marilyn E. Jacox, Warren E. Thompson
When a Ne: HCOOH sample is codeposited at ca. 5 K with neon atoms that have been passed through a microwave discharge, new absorptions appear in the infrared spectrum of the resulting solid which can be assigned to trans-HOCO, trans-HCOOH +, and HCO 2 -

MatML: A Data Interchange Markup Language

November 1, 2003
Author(s)
J G. Kaufman, E F. Begley
This paper updates and expands upon previously published information on MatML, a new extensible markup language designed specifically for the exchange of materials information. In particular, it will describe the strengths of MatML from the perspective of

Microscopy and Spectroscopy of Lithium Nickel Oxide Based Particles Used in High-Power Lithium-Ion Cells

November 1, 2003
Author(s)
D Abraham, R D. Twesten, Mahalingam Balasubramanian, J Kropf, Daniel A. Fischer, James McBreen, I Petrov, K Amine
Structural and electronic investigations were conducted on lithium nickel oxide based particles used in positive electrodes of 18650-type high power lithium-ion cells. K-edge X-ray absorption spectroscopy (XAS) revealed trivalent Ni and Co ions in the bulk

Multimodal Biometrics: Issues in Design and Testing

November 1, 2003
Author(s)
Robert D. Snelick, Michael D. Indovina, James H. Yen, Alan Mink
The results of experimental studies on multimodal biometric systems for small-scale populations have shown better performance compared to single-mode biometric systems. We examine if such techniques scale to larger populations, introduce a methodology to

Network Security Testing

November 1, 2003
Author(s)
Shirley M. Radack
This ITL Bulletin summarizes NIST Special Publication 800-42, Guideline on Network Security Testing, by John Wack, Miles Tracy, and Murugiah Souppaya, which assists organizations in testing their Internet-connected and operational systems. The guide
Displaying 40351 - 40375 of 73960
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