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Displaying 38751 - 38775 of 73829

Spectral Characterization of HST Calibration Lamps - New Pt/Ct-Ne Line Catalogues and Ageing Test

June 25, 2004
Author(s)
F Kerber, Michael R. Rosa, Craig J. Sansonetti, Joseph Reader, Gillian Nave, P Bristow, M Fiorentio, G Lercher
The Space Telescope European Coordinating Facility's (ST-ECF) lamp project, funded directly by the European Space Agency (ESA), is dedicated to the study of hollow cathode calibration lamps as they are used onboard the Hubble Space Telescope (HST). There

Mems-Based Embedded Sensor Virtual Components for SOC

June 24, 2004
Author(s)
Muhammad Afridi, Allen R. Hefner Jr., David W. Berning, Colleen E. Hood, Ankush Varma, Bruce Jacob, Stephen Semancik
The design and implementation of a monolithic MEMS-based (Micro Electro Mechanical Systems) gas sensor virtual component is described. A bulk micromachining technique is used to create suspended microhotplate structures. The thermal properties of the

Reliability of SiC MOS Devices

June 24, 2004
Author(s)
Ranbir Singh, Allen R. Hefner Jr.
Fundamental limitations to oxide reliability are analyzed in silicon carbide based devices. A barrier height primarily determined by band offsets between metal/SiC and the dielectric, and the electric field in the dielectric results in tunneling current

Studies of One-to-One Fingerprint Matching With Vendor SDK Matchers

June 24, 2004
Author(s)
Craig I. Watson, Charles L. Wilson, Karen Marshall, Michael D. Indovina, Robert D. Snelick
NIST has conducted testing of one-to-one SDK (Software Development Kit) based COTS fingerprint matching systems to evaluate the accuracy of one-to-one matching used in the US-VISIT program. Fingerprint matching systems from eight vendors not used in US

Gas Flowmeter Calibrations with the 34 L and 677 L PVTt Standards

June 23, 2004
Author(s)
John D. Wright, Aaron N. Johnson, Michael R. Moldover, Gina M. Kline
This document provides a description of the 34 L and 677 L pressure, volume, temperature, and time (PVTt) primary gas flow standards operated by the National Institute of Standards and Technology (NIST) Fluid Flow Group. These facilities are used to

Phase Relationships in the BaO-Sm 2 O 3 -CuO x System Under 100Pa O 2

June 23, 2004
Author(s)
Winnie K. Wong-Ng, Lawrence P. Cook, J Suh, James A. Kaduk
By applying controlled atmosphere methods to minimize the presence of carbonate, and CO 2 and H 2O contamination, subsolidus phase equilibria of the BaO-Sm 2O 3-CuOx system at pO 2 = 100 Pa (0.1 % O 2 by volume) were successfully determined. Under

Structure and Chemical Characterization of Self-Assembled Mono-Fluoro-Substituted Oligo(phenylene-ethynlyene) Monolayers on Gold

June 22, 2004
Author(s)
Christina Hacker, James D. Batteas, J C. Garno, Manuel Marquez, Curt A. Richter, Lee J. Richter, Roger D. van Zee, Christopher D. Zangmeister
Monolayers of oligo(phenylene-ethynylene) (OPE) molecules have exhibited promise in molecular electronic test structures. This paper discusses films formed from novel molecules within this class, 2-fluoro-4-phenylethynyl-1-[(4-acetylthio)-phenylethynyl

Structure Characterization of Porous Interlevel Dielectric Films

June 21, 2004
Author(s)
Wen-Li Wu, Eric K. Lin, Christopher L. Soles
To extend the dielectric constant of interlevel dielectrics below a value of ~2.6 seen in today s IC chips, porous low-k material has been evaluated as a viable candidate by industries. In this paper, the current status and the future need in metrologies

Molecular Devices Formed by Direct Monolayer Attachment to Silicon

June 17, 2004
Author(s)
Curt A. Richter, Christina Hacker, Lee J. Richter, Eric M. Vogel
We present the results of studies of solution-based attachment of long-chain aliphatic molecules to hydrogen-terminated Si surfaces formed to determine the electrical properties of hybrid silicon-molecular nanoelectronic devices. We have applied an

Software Fault Complexity and Implications for Software Testing

June 16, 2004
Author(s)
D. Richard Kuhn, D Wallace, A M. Gallo
Exhaustive testing of computer software is intractable, but empirical studies of software failures suggest that testing can in some cases be effectively exhaustive. Data reported in this study and others show that software failures in a variety of domains
Displaying 38751 - 38775 of 73829
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