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X-Ray Diffraction Characterisation of Nanoparticle Size and Shape Distributions: Application to Bimodal Distributions

Published

Author(s)

N G. Armstrong, W Kalceff, James Cline, John E. Bonevich, P A. Lynch, C C. Tang, S P. Thompson
Proceedings Title
Annual Condensed Matter and Materials Meeting | 28th | 28th Annual Condensed Matter and Materials Meeting | Australian Institute of Physics
Conference Dates
February 3-6, 2004
Conference Location
Wagga Wagga, 1, AS
Conference Title
Condensed Matter and Materials Meeting

Keywords

Bayesian/Maximum entropy, Markov Chain Monte Carlo (MCMC), SRM, XRD

Citation

Armstrong, N. , Kalceff, W. , Cline, J. , Bonevich, J. , Lynch, P. , Tang, C. and Thompson, S. (2004), X-Ray Diffraction Characterisation of Nanoparticle Size and Shape Distributions: Application to Bimodal Distributions, Annual Condensed Matter and Materials Meeting | 28th | 28th Annual Condensed Matter and Materials Meeting | Australian Institute of Physics, Wagga Wagga, 1, AS (Accessed June 12, 2024)

Issues

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Created September 29, 2004, Updated October 12, 2021