Armstrong, N.
, Kalceff, W.
, Cline, J.
, Bonevich, J.
, Lynch, P.
, Tang, C.
and Thompson, S.
(2004),
X-Ray Diffraction Characterisation of Nanoparticle Size and Shape Distributions: Application to Bimodal Distributions, Annual Condensed Matter and Materials Meeting | 28th | 28th Annual Condensed Matter and Materials Meeting | Australian Institute of Physics, Wagga Wagga, 1, AS
(Accessed April 19, 2024)
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X-Ray Diffraction Characterisation of Nanoparticle Size and Shape Distributions: Application to Bimodal Distributions
Published
Author(s)
N G. Armstrong, W Kalceff, , , P A. Lynch, C C. Tang, S P. Thompson
Proceedings Title
Annual Condensed Matter and Materials Meeting | 28th | 28th Annual Condensed Matter and Materials Meeting | Australian Institute of Physics
Conference Dates
February 3-6, 2004
Conference Location
Wagga Wagga, 1, AS
Conference Title
Condensed Matter and Materials Meeting
Pub Type
Conferences
Keywords
Bayesian/Maximum entropy, Markov Chain Monte Carlo (MCMC), SRM, XRD
Citation
Created September 29, 2004, Updated October 12, 2021