Boynton, P.
(2004),
Tools and Diagnostics to Assess and Improve Projection Display Metrology Capabilities, SID Americas Display Engineering and Applications Conference Digest of Technical Papers, Ft. Worth, TX
(Accessed December 4, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Tools and Diagnostics to Assess and Improve Projection Display Metrology Capabilities
Published
Author(s)
Abstract
When characterizing or calibrating electronic projection display systems, the technical staff needs to understand the capabilities and limitations of the measuring instrumentation used and the procedures implemented. Once these parameters are established, the metrologist can make meaningful decisions about the appropriateness of the instrument and procedure, identify potential errors, and remedy solutions if applicable. Several tools are introduced to facilitate the assessment of display measurement systems: Employing these tools, one can better understand the measurement capabilities of the facility and possibly make desired improvements.Proceedings Title
SID Americas Display Engineering and Applications Conference Digest of Technical Papers
Conference Dates
October 26-27, 2004
Conference Location
Ft. Worth, TX
Conference Title
Americas Display Engineering and Applications Conference of the Society for Information Display
Pub Type
Conferences
Keywords
diagnostics, display metrology, measurement, projection displays
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 1, 2004, Updated January 27, 2020