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Displaying 37201 - 37225 of 74045

Propagating Waves of Network Formation Induced by Light

March 1, 2005
Author(s)
J Cabral, Jack F. Douglas
The exposure of a photopolymerizable liquid to ultraviolet (UV) radiation leads to a propagating wavefront of network formation that invades the unpolymerized material from the illuminated surface of the photosensitive material. We theoretically describe

Protocol Modifications for the DNS Security Extensions RFC 4035

March 1, 2005
Author(s)
R Arends, R Austein, M Larson, Daniel Massey, Scott W. Rose
This document is part of a family of documents that describe the DNS Security Extensions (DNSSEC). The DNS Security Extensions are a collection of new resource records and protocol modifications that add data origin authentication and data integrity to the

R-22 Replacement Status (in Portuguese) Part 1 and Part 2

March 1, 2005
Author(s)
J M. Calm, Piotr A. Domanski
Since its initial recognition in 1928 and commercialization in 1936, R-22 has been applied in systems ranging from the smallest window air conditioners to the largest chillers and heat pumps, including those for district cooling and heating. Individual

Rapid Fixation of Methylene Chloride By a Macrocyclic Amine

March 1, 2005
Author(s)
J C. Lee, Keith J. Stanger, Bruce C. Noll, Carlos A. Gonzalez, M Marquez, Bradley D. Smith
A simple macrocyclic amine is alkylated by methylene chloride to give a quaternary ammonium chloride salt. When methylene chloride is the solvent, the reaction exhibits pseudo first order kinetics, and the reaction half-life at 25.0 C is 2.0 minutes. The

Rate Constants for Reactions of Phenoxyl Radicals in Solution

March 1, 2005
Author(s)
Pedatsur Neta, J Grodkowski
Absolute rate constants for reactions of phenoxyl radicals in solution have been compiled and evaluated from the literature. Rate constants are included for phenoxyl radicals bearing various substituents, including semiquinone radicals and radical ions, as

Resource Records for the DNS Security Extensions, RFC 4034

March 1, 2005
Author(s)
R Arends, R Austein, M Larson, Daniel Massey, Scott W. Rose
This document is part of a family of documents that describe the DNS Security Extensions (DNSSEC). The DNS Security Extensions are a collection of resource records and protocol modifications that provide source authentication for the DNS. This document

Second Harmonic Magneto-Resistive Imaging to Authenticate and Recover Data from Magnetic Storage Media

March 1, 2005
Author(s)
David P. Pappas, Alexey Nazarov, D Stevenson, Steven Voran, Mike E. Read, Erin M. Gormley, James Cash, Ken Marr, James Ryan
A scanning magneto-resistive (MR) microscope was developed for high resolution imaging of magnetic tapes and digital media. Second harmonic detection was used to remove thermal anomalies. We were able to image sufficient lengths of tape for authentication

Slap Fingerprint Segmentation Evaluation 2004 Analysis Report

March 1, 2005
Author(s)
Brad Ulery, R. A. Hicklin, Craig I. Watson, Michael D. Indovina, Kayee Hanaoka
The Slap Fingerprint Segmentation Evaluation 2004 (Slap Seg04) was conducted to assess the accuracy of algorithms used to segment slap fingerprint images into individual fingerprint images. Segmenters from ten different organizations were evaluated on data

Technology for the Information Commons in a Special Library

March 1, 2005
Author(s)
Nancy Allmang, Rosa Liu
Recently, Information Commons has become a buzzword with two meanings--a gathering place for collaborating and sharing new technologies, or a virtual spot for disseminating intellectual information. This case study highlights technologies utilized by a

Testing BIOS Interrupt 0x13 Based Software Write Blockers

March 1, 2005
Author(s)
James R. Lyle, Paul E. Black
We report observations and experience in the Computer Forensics Tool Testing (CFTT) project while developing methodologies to test interrupt 0x13 based software write block (SWB) tools. A write blocker allows access to all data on a storage device while

Through-Thickness Texture Inhomogeneity in a Recrystallized Al-Mg Alloy

March 1, 2005
Author(s)
J -. Liu, Stephen W. Banovic, Frank S. Biancaniello, Rodney D. Jiggetts
Through-thickness texture of a rolled and recrystallized Al-Mg continuous cast alloy was examined using electron backscattered diffraction. Results showed the recrystallization texture through thickness of the sheet was inhomogeneous with Cube 001}

Toward Data Standards for Proteomics Data

March 1, 2005
Author(s)
Veerasamy Ravichandran, Ram D. Sriram
Biologists have traditionally worked with relatively small data sets and shared results only with others working on similar biological systems. With the advent of genomics, and now proteomics, they are faced with exponentially growing sets of highly inter

Understanding Failure Response in Service Discovery Systems

March 1, 2005
Author(s)
Kevin L. Mills, Stephen Quirolgico, Christopher E. Dabrowski
Service discovery systems enable distributed components to find each other without prior arrangement, to express capabilities and needs, to aggregate into useful compositions, and to detect and adapt to changes. First-generation discovery systems can be

Web-Based 3D Visualization in a Digital Library of Mathematical Functions

March 1, 2005
Author(s)
Qiming Wang, Bonita V. Saunders
The National Institute of Standards and Technology (NIST) is developing a digital library of mathematical functions to replace the widely used National Bureau of Standards Handbook of Mathematical Functions published in 1964 [1]. The NIST Digital Library

X-ray Absorption Spectroscopy to Probe Surface Composition and Surface Deprotection in Photoresist Films

March 1, 2005
Author(s)
Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, Daniel A. Fischer, S Sambasivan, Eric K. Lin, Ronald L. Jones, Christopher Soles, Wen-Li Wu, D M. Goldfarb, M Angelopoulos
We utilize near edge x-ray absorption fine structure spectroscopy (NEXAFS) to provide chemical insight into surface chemical effects in model photo-resist films. First, NEXAFS was used to examine the resist/air interface including surface segregration of a

Detailed Study and Projection of Hard Breakdown Evolution in Ultra-Thin Gate Oxides

February 28, 2005
Author(s)
John S. Suehle, Baozhong Zhu, Yuan Chen, J B. Bernstein
The mechanism responsible for post soft-breakdown leakage current increase in ultra-thin oxides depends on the nature of the conducting filament formed at the instant of dielectric breakdown. The conductance of the filament formed during soft breakdown has
Displaying 37201 - 37225 of 74045
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