September 1, 2005
Author(s)
Aleksander Jablonski, Francesc Salvat, Cedric J. Powell
Quantification of surface and bulk analytical methods, e.g., Auger-electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), electron-probe microanalysis (EPMA) and analytical electron microscopy (AEM), requires knowledge of reliable elastic