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Fracture Strength of Silicon Carbide Microspecimens

Published

Author(s)

W N. Sharpe, O Jadaan, G M. Beheim, George D. Quinn, N N. Nemeth

Abstract

Micro silicon carbide tension specimen were prepared with straight, curved, and notched gage lengths. These were tested to failure and the strengths analyzed by Weibull statistics. Fractographic analysis confirmed that strength limiting flaws were etch grooves associated with large, favorably oriented SiC grains.
Citation
Journal of Micromechanics and Microengineering
Volume
14
Issue
No. 5

Keywords

chemical vapor deposition, fractography, silicon carbide, tension strength, weibull distribution

Citation

Sharpe, W. , Jadaan, O. , Beheim, G. , Quinn, G. and Nemeth, N. (2005), Fracture Strength of Silicon Carbide Microspecimens, Journal of Micromechanics and Microengineering (Accessed April 14, 2024)
Created September 30, 2005, Updated October 12, 2021