Fracture Strength of Silicon Carbide Microspecimens
W N. Sharpe, O Jadaan, G M. Beheim, George D. Quinn, N N. Nemeth
Micro silicon carbide tension specimen were prepared with straight, curved, and notched gage lengths. These were tested to failure and the strengths analyzed by Weibull statistics. Fractographic analysis confirmed that strength limiting flaws were etch grooves associated with large, favorably oriented SiC grains.
Journal of Micromechanics and Microengineering
chemical vapor deposition, fractography, silicon carbide, tension strength, weibull distribution