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Search Publications

NIST Authors in Bold

Displaying 33976 - 34000 of 73697

Real Time Shape Evolution of Nanoimprinted Polymer Structures During Thermal Annealing

July 18, 2006
Author(s)
Ronald L. Jones, T Hu, Christopher L. Soles, Eric K. Lin, R M. Reano, Stella W. Pang, D M. Casa
The real time shape of nanoimprinted polymer patterns are measured as a function of annealing temperature and time using a new metrology technique, Critical Dimension Small Angle X-ray Scattering (CD-SAXS). Periodicity, linewidth, line height, and sidewall

Some Difficult Problems in the Modeling of Fire Spread

July 16, 2006
Author(s)
Kathryn M. Butler, Thomas J. Ohlemiller
A fire and the objects involved in the fire form a highly complex dynamic system. Important processes occur over a wide range of spatial and temporal scales, from the microscales of thermodynamics and chemical kinetics, through the mesoscales of heat

Trapped atomic ions and quantum information processing

July 16, 2006
Author(s)
David J. Wineland, Dietrich G. Leibfried, James C. Bergquist, Brad R. Blakestad, John J. Bollinger, Joseph W. Britton, J Chiaverini, Ryan Epstein, David Hume, Wayne M. Itano, John D. Jost, Emanuel H. Knill, Jeroen Koelemeij, C. Langer, R Ozeri, Rainer Reichle, Till P. Rosenband, Tobias Schaetz, Piet Schmidt, Signe Seidelin, Nobuyasu Shiga, Janus Wesenberg
The basic requirements for quantum computing and quantum simulation (Single- and multi-qubit gates, long memor times, etc.)have been demonstrated in separate experiments on trapped ions. Construction of a large-scale information processor will require

100 mV ac-dc Transfer Standard measurements with a Pulse-driven AC Josephson Voltage Standard

July 14, 2006
Author(s)
Samuel P. Benz, Charles J. Burroughs, Paul D. Dresselhaus, Thomas E. Lipe, Joseph R. Kinard Jr.
In order to improve the low-voltage calibration service at NIST we have constructed an ac Josephson voltage standard system with a maximum rms output voltage of 100 mV. Using this system we synthesized sinewaves of various audio frequencies and measured ac

A single-atom optical clock with high accuracy

July 14, 2006
Author(s)
Windell Oskay, Scott A. Diddams, Elizabeth A. Donley, Tara M. Fortier, Thomas P. Heavner, Leo W. Hollberg, Wayne M. Itano, Steven R. Jefferts, M J. Jensen, Kyoungsik Kim, F Levi, Thomas E. Parker, James C. Bergquist
For the past fifty years, atomic frequency standards based on the cesium ground-state hyperfine splitting have been the most accurate timepieces in the world. One of the most accurate, current-generation, cesium standards is the NIST-F1 fountain, which has

Development of a 60 Hz Power Standard using SNS Programmable Josephson Voltage Standards

July 14, 2006
Author(s)
Charles J. Burroughs, Samuel Benz, Paul Dresselhaus, Yonuk Chong, Bryan C. Waltrip, Thomas L. Nelson, J. Williams
We are implementing a new standard for 60 Hz mains power based on precision sinusoidal reference voltages from two independent Programmable Josephson Voltage Standards (PJVS) (one for voltage and one for current). Our NIST PJVS systems are based on

On-Wafer Noise-Parameter Measurements at NIST

July 14, 2006
Author(s)
James P. Randa, Dave K. Walker
NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and the uncertainty analysis and present results of measurements on a very poorly matched transistor

Supplementary Comparison of RF Power Measurements with 2.4 mm Connectors, CCEM.RF-S1.CL

July 14, 2006
Author(s)
Thomas P. Crowley, J Miall, J dereede, J. Furrer, A Michaud, E. Dressler, T Zhang, K. Shimaoka, J H. Kim
We present the results of a supplementary comparison in RF power measurements with 2.4 mm connectors. This is the highest frequency RF power comparison with coaxial connectors. All participant measurements agree with the reference values within their

Terahertz radiometer design for traceable noise-temperature measurements

July 14, 2006
Author(s)
Eyal Gerecht, Dazhen Gu, James P. Randa, Dave K. Walker, Robert L. Billinger
We report on design of a radiometer for traceable noise-temperature measurements at terahertz frequencies, including noise measurements on cryogenic IF components, development and test of quasi-optical adapter technology, development of black body

VARIABILITY OF CHARGE NOISE IN Al-BASED SET TRANSISTORS

July 14, 2006
Author(s)
Mark W. Keller, Blaise Jeanneret, Joe Aumentado
We measured the charge noise of four Al-based SET transistors on multiple cooldowns. We found a consistent 1/f component independent of thermal cycling and other treatments, but large variations in the total noise spectrum due to two-level fluctuators.

Experimental separability of channeling giant magnetoresistance in Co/Cu/Co

July 13, 2006
Author(s)
William E. Bailey, Stephen E. Russek, X.-G. Zhang, W. H. Butler
The magnitude of the electronic channeling contribution is a significant open issue in the understanding of giant magnetoresistance (GMR). We show that for the technologically important system Co/Cu/Co, channeling GMR can be isolatedand quantified

Cement Hydration: Building Bridges and Dams at the Microstructure Level

July 12, 2006
Author(s)
Dale P. Bentz
The concurrent goals of cement hydration are to percolate (bridge) the original cement particles into a load-bearing network and to depercolate (dam) the original water-filled capillary porosity. The initial volume, particle size distribution, and

Mapping substrate/film adhesion with contact-resonance-frequency AFM

July 12, 2006
Author(s)
Donna C. Hurley, Malgorzata Kopycinska-Mueller, Eric Langlois, Tony B. Kos, Nicholas Barbosa
We demonstrate contact-resonance-frequency atomic force microscopy (AFM) techniques to nondestructively image variations in adhesion at a substrate/film interface. Contact-resonance-frequency imaging is a dynamic AFM technique to measure the contact

Mapping substrate/film adhesion with contact-resonance-frequency atomic force microscopy

July 12, 2006
Author(s)
Donna C. Hurley, M Kopycinski-Muller, Eric Langlois, Anthony B. Kos, N. Barbosa
We have used contact-resonance-frequency atomic force microscopy techniques to nondestructively image variations in adhesion as a buried interface. Images were acquired on a sample containing a 20nm gold (Au) blanket film on silicon (Si) with a 1 nm

Supplementary Backward Equations for Pressure as a Function of Enthalpy and Entropy p(h,s) to the Industrial Formulation IAPWS-IF97 for Water and Steam

July 11, 2006
Author(s)
H J. Kretzschmar, J Cooper, A Dittmann, J Trubenbach, Th Willkommen, Daniel G. Friend, J S. Gallagher, Radim Mares, Kiyoshi Miyagawa, Wolfgang Wagner, K Knobloch, I. Stocker
In 2001, the International Association for the Properties of Water and Steam (IAPWS) adopted backward equations for pressure as a function of enthalpy and entropy p(h, s) as supplement to the IAPWS Industrial Formulation 1997 for the Termodynamic
Displaying 33976 - 34000 of 73697
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